LENGTH MEASURING DEVICE
In a length measuring device with a measuring transducer system, the curve of two sinusoidal test signals is dependent on the longitudinal movement of the measuring transducer system. An interpolation circuit delivers two high-resolution rectangular pulse sequences F1, F2 corresponding to the interp...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | OTTO KLINGLER SIEGFRIED GRUHLER |
| description | In a length measuring device with a measuring transducer system, the curve of two sinusoidal test signals is dependent on the longitudinal movement of the measuring transducer system. An interpolation circuit delivers two high-resolution rectangular pulse sequences F1, F2 corresponding to the interpolated sinusoidal voltages and offset by 90 DEG , to an evaluating circuit. To achieve a high-resolution at low speeds of travel and a low-resolution at high speeds, two rectangular pulse sequences S1, S2 or G1, G2, offset by 90 DEG and giving a low-resolution, are additionally derived at the interpolation circuit. A control logic circuit 19 monitors the test voltages for attainment of a certain value of the longitudinal movement per unit time or speed of travel. The control logic circuit lets only the low-resolution rectangular pulse sequences through to the evaluating circuit when this value is exceeded, while it lets the high-resolution rectangular pulse sequences with the low-resolution rectangular pulse sequences when this value is not reached. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_GB2156977B</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>GB2156977B</sourcerecordid><originalsourceid>FETCH-epo_espacenet_GB2156977B3</originalsourceid><addsrcrecordid>eNrjZBD3cfVzD_FQ8HV1DA4N8vRzV3BxDfN0duVhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfHuTkaGpmaW5uZOxoRVAABYdx6T</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>LENGTH MEASURING DEVICE</title><source>esp@cenet</source><creator>OTTO KLINGLER ; SIEGFRIED GRUHLER</creator><creatorcontrib>OTTO KLINGLER ; SIEGFRIED GRUHLER</creatorcontrib><description>In a length measuring device with a measuring transducer system, the curve of two sinusoidal test signals is dependent on the longitudinal movement of the measuring transducer system. An interpolation circuit delivers two high-resolution rectangular pulse sequences F1, F2 corresponding to the interpolated sinusoidal voltages and offset by 90 DEG , to an evaluating circuit. To achieve a high-resolution at low speeds of travel and a low-resolution at high speeds, two rectangular pulse sequences S1, S2 or G1, G2, offset by 90 DEG and giving a low-resolution, are additionally derived at the interpolation circuit. A control logic circuit 19 monitors the test voltages for attainment of a certain value of the longitudinal movement per unit time or speed of travel. The control logic circuit lets only the low-resolution rectangular pulse sequences through to the evaluating circuit when this value is exceeded, while it lets the high-resolution rectangular pulse sequences with the low-resolution rectangular pulse sequences when this value is not reached.</description><edition>4</edition><language>eng</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; MEASURING ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING</subject><creationdate>1988</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19880217&DB=EPODOC&CC=GB&NR=2156977B$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=19880217&DB=EPODOC&CC=GB&NR=2156977B$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>OTTO KLINGLER</creatorcontrib><creatorcontrib>SIEGFRIED GRUHLER</creatorcontrib><title>LENGTH MEASURING DEVICE</title><description>In a length measuring device with a measuring transducer system, the curve of two sinusoidal test signals is dependent on the longitudinal movement of the measuring transducer system. An interpolation circuit delivers two high-resolution rectangular pulse sequences F1, F2 corresponding to the interpolated sinusoidal voltages and offset by 90 DEG , to an evaluating circuit. To achieve a high-resolution at low speeds of travel and a low-resolution at high speeds, two rectangular pulse sequences S1, S2 or G1, G2, offset by 90 DEG and giving a low-resolution, are additionally derived at the interpolation circuit. A control logic circuit 19 monitors the test voltages for attainment of a certain value of the longitudinal movement per unit time or speed of travel. The control logic circuit lets only the low-resolution rectangular pulse sequences through to the evaluating circuit when this value is exceeded, while it lets the high-resolution rectangular pulse sequences with the low-resolution rectangular pulse sequences when this value is not reached.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>MEASURING</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1988</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZBD3cfVzD_FQ8HV1DA4N8vRzV3BxDfN0duVhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfHuTkaGpmaW5uZOxoRVAABYdx6T</recordid><startdate>19880217</startdate><enddate>19880217</enddate><creator>OTTO KLINGLER</creator><creator>SIEGFRIED GRUHLER</creator><scope>EVB</scope></search><sort><creationdate>19880217</creationdate><title>LENGTH MEASURING DEVICE</title><author>OTTO KLINGLER ; SIEGFRIED GRUHLER</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_GB2156977B3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1988</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>MEASURING</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>OTTO KLINGLER</creatorcontrib><creatorcontrib>SIEGFRIED GRUHLER</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>OTTO KLINGLER</au><au>SIEGFRIED GRUHLER</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>LENGTH MEASURING DEVICE</title><date>1988-02-17</date><risdate>1988</risdate><abstract>In a length measuring device with a measuring transducer system, the curve of two sinusoidal test signals is dependent on the longitudinal movement of the measuring transducer system. An interpolation circuit delivers two high-resolution rectangular pulse sequences F1, F2 corresponding to the interpolated sinusoidal voltages and offset by 90 DEG , to an evaluating circuit. To achieve a high-resolution at low speeds of travel and a low-resolution at high speeds, two rectangular pulse sequences S1, S2 or G1, G2, offset by 90 DEG and giving a low-resolution, are additionally derived at the interpolation circuit. A control logic circuit 19 monitors the test voltages for attainment of a certain value of the longitudinal movement per unit time or speed of travel. The control logic circuit lets only the low-resolution rectangular pulse sequences through to the evaluating circuit when this value is exceeded, while it lets the high-resolution rectangular pulse sequences with the low-resolution rectangular pulse sequences when this value is not reached.</abstract><edition>4</edition><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng |
| recordid | cdi_epo_espacenet_GB2156977B |
| source | esp@cenet |
| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING |
| title | LENGTH MEASURING DEVICE |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T20%3A28%3A46IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=OTTO%20KLINGLER&rft.date=1988-02-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EGB2156977B%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |