VECTOR NETWORK ANALYZER WITH INTEGRAL PROCESSOR

VECTOR NETWORK ANALYZER WITH INTEGRAL PROCESSOR

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Hauptverfasser: WAYNE C CANNON, JOHN T BARR, MARK DONALD ROOS, MICHAEL J NEERING, DAVID D SHARRIT, S BRUCE DONECKER
Format: Patent
Sprache:eng
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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container_title
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creator WAYNE C CANNON
JOHN T BARR
MARK DONALD ROOS
MICHAEL J NEERING
DAVID D SHARRIT
S BRUCE DONECKER
description
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_GB2154752A</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>GB2154752A</sourcerecordid><originalsourceid>FETCH-epo_espacenet_GB2154752A3</originalsourceid><addsrcrecordid>eNrjZNAPc3UO8Q9S8HMNCfcP8lZw9HP0iYxyDVII9wzxUPD0C3F1D3L0UQgI8nd2DQ72D-JhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfHuTkaGpibmpkaOxoRVAACh8CWL</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>VECTOR NETWORK ANALYZER WITH INTEGRAL PROCESSOR</title><source>esp@cenet</source><creator>WAYNE C CANNON ; JOHN T BARR ; MARK DONALD ROOS ; MICHAEL J NEERING ; DAVID D SHARRIT ; S BRUCE DONECKER</creator><creatorcontrib>WAYNE C CANNON ; JOHN T BARR ; MARK DONALD ROOS ; MICHAEL J NEERING ; DAVID D SHARRIT ; S BRUCE DONECKER</creatorcontrib><edition>4</edition><language>eng</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>1985</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19850911&amp;DB=EPODOC&amp;CC=GB&amp;NR=2154752A$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=19850911&amp;DB=EPODOC&amp;CC=GB&amp;NR=2154752A$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WAYNE C CANNON</creatorcontrib><creatorcontrib>JOHN T BARR</creatorcontrib><creatorcontrib>MARK DONALD ROOS</creatorcontrib><creatorcontrib>MICHAEL J NEERING</creatorcontrib><creatorcontrib>DAVID D SHARRIT</creatorcontrib><creatorcontrib>S BRUCE DONECKER</creatorcontrib><title>VECTOR NETWORK ANALYZER WITH INTEGRAL PROCESSOR</title><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>1985</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNAPc3UO8Q9S8HMNCfcP8lZw9HP0iYxyDVII9wzxUPD0C3F1D3L0UQgI8nd2DQ72D-JhYE1LzClO5YXS3Azybq4hzh66qQX58anFBYnJqXmpJfHuTkaGpibmpkaOxoRVAACh8CWL</recordid><startdate>19850911</startdate><enddate>19850911</enddate><creator>WAYNE C CANNON</creator><creator>JOHN T BARR</creator><creator>MARK DONALD ROOS</creator><creator>MICHAEL J NEERING</creator><creator>DAVID D SHARRIT</creator><creator>S BRUCE DONECKER</creator><scope>EVB</scope></search><sort><creationdate>19850911</creationdate><title>VECTOR NETWORK ANALYZER WITH INTEGRAL PROCESSOR</title><author>WAYNE C CANNON ; JOHN T BARR ; MARK DONALD ROOS ; MICHAEL J NEERING ; DAVID D SHARRIT ; S BRUCE DONECKER</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_GB2154752A3</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng</language><creationdate>1985</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WAYNE C CANNON</creatorcontrib><creatorcontrib>JOHN T BARR</creatorcontrib><creatorcontrib>MARK DONALD ROOS</creatorcontrib><creatorcontrib>MICHAEL J NEERING</creatorcontrib><creatorcontrib>DAVID D SHARRIT</creatorcontrib><creatorcontrib>S BRUCE DONECKER</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WAYNE C CANNON</au><au>JOHN T BARR</au><au>MARK DONALD ROOS</au><au>MICHAEL J NEERING</au><au>DAVID D SHARRIT</au><au>S BRUCE DONECKER</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>VECTOR NETWORK ANALYZER WITH INTEGRAL PROCESSOR</title><date>1985-09-11</date><risdate>1985</risdate><edition>4</edition><oa>free_for_read</oa></addata></record>
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language eng
recordid cdi_epo_espacenet_GB2154752A
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title VECTOR NETWORK ANALYZER WITH INTEGRAL PROCESSOR
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-09T23%3A16%3A10IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WAYNE%20C%20CANNON&rft.date=1985-09-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EGB2154752A%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true