UNITE DE DETECTION DE DEFAUT DESTINEE A UN DISPOSITIF DE DETECTION D'ANGLE DE ROTATION

The unit has a return state evaluation section (537) determining whether an electrical angle i.e. rotational angle, is modified on all its range and evaluating that a rotational angle detection device is return back from a temporary defect state to a normal state, based on the angle and a defect eva...

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Bibliographische Detailangaben
Hauptverfasser:	KAMEYA HISASHI, HIDAKA KENICHIRO
Format:	Patent
Sprache:	fre
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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Beschreibung
Zusammenfassung:	The unit has a return state evaluation section (537) determining whether an electrical angle i.e. rotational angle, is modified on all its range and evaluating that a rotational angle detection device is return back from a temporary defect state to a normal state, based on the angle and a defect evaluation value. A determined defect evaluation section (538) evaluates that the device is found in a determined defect state, based on continuation of the evaluation during a time interval that is longer than a preset time interval, and determines a defect appearance in the device.