PROCEDE DE MESURE OPTIQUE D'UNE COUCHE EN TEMPS REEL, EN INCIDENCE NORMALE

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Hauptverfasser: AMARY PASCAL, BENFERHAT RAMDANE, CATTELAN DENIS
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creator AMARY PASCAL
BENFERHAT RAMDANE
CATTELAN DENIS
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_FR2891904B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>FR2891904B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_FR2891904B13</originalsourceid><addsrcrecordid>eNrjZPAKCPJ3dnVxVQAiX9fg0CBXBf-AEM_AUKCIeqifq4Kzf6izh6uCq59CiKtvQLBCkKurjw6I6-nn7Oni6ufsquDnH-Tr6OPKw8CalphTnMoLpbkZFNxcQ5w9dFML8uNTiwsSk1PzUkvi3YKMLCwNLQ1MnAyNiVACALeaLGM</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PROCEDE DE MESURE OPTIQUE D'UNE COUCHE EN TEMPS REEL, EN INCIDENCE NORMALE</title><source>esp@cenet</source><creator>AMARY PASCAL ; BENFERHAT RAMDANE ; CATTELAN DENIS</creator><creatorcontrib>AMARY PASCAL ; BENFERHAT RAMDANE ; CATTELAN DENIS</creatorcontrib><language>fre</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2007</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20071221&amp;DB=EPODOC&amp;CC=FR&amp;NR=2891904B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20071221&amp;DB=EPODOC&amp;CC=FR&amp;NR=2891904B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>AMARY PASCAL</creatorcontrib><creatorcontrib>BENFERHAT RAMDANE</creatorcontrib><creatorcontrib>CATTELAN DENIS</creatorcontrib><title>PROCEDE DE MESURE OPTIQUE D'UNE COUCHE EN TEMPS REEL, EN INCIDENCE NORMALE</title><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2007</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZPAKCPJ3dnVxVQAiX9fg0CBXBf-AEM_AUKCIeqifq4Kzf6izh6uCq59CiKtvQLBCkKurjw6I6-nn7Oni6ufsquDnH-Tr6OPKw8CalphTnMoLpbkZFNxcQ5w9dFML8uNTiwsSk1PzUkvi3YKMLCwNLQ1MnAyNiVACALeaLGM</recordid><startdate>20071221</startdate><enddate>20071221</enddate><creator>AMARY PASCAL</creator><creator>BENFERHAT RAMDANE</creator><creator>CATTELAN DENIS</creator><scope>EVB</scope></search><sort><creationdate>20071221</creationdate><title>PROCEDE DE MESURE OPTIQUE D'UNE COUCHE EN TEMPS REEL, EN INCIDENCE NORMALE</title><author>AMARY PASCAL ; BENFERHAT RAMDANE ; CATTELAN DENIS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_FR2891904B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>fre</language><creationdate>2007</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>AMARY PASCAL</creatorcontrib><creatorcontrib>BENFERHAT RAMDANE</creatorcontrib><creatorcontrib>CATTELAN DENIS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>AMARY PASCAL</au><au>BENFERHAT RAMDANE</au><au>CATTELAN DENIS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PROCEDE DE MESURE OPTIQUE D'UNE COUCHE EN TEMPS REEL, EN INCIDENCE NORMALE</title><date>2007-12-21</date><risdate>2007</risdate><oa>free_for_read</oa></addata></record>
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recordid cdi_epo_espacenet_FR2891904B1
source esp@cenet
subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
title PROCEDE DE MESURE OPTIQUE D'UNE COUCHE EN TEMPS REEL, EN INCIDENCE NORMALE
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-30T18%3A18%3A54IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=AMARY%20PASCAL&rft.date=2007-12-21&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EFR2891904B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true