Electro-optic micrometer for measuring physical magnitude, has control device controlling coherently optical source, detector and processing unit, which process voltage detection signal to provide measurement signal, based on magnitude

The micrometer has an optical source (EM) electrically controlled to emit light beams comprising wavelengths. An optical detector (DEC) detects a light signal at the wavelengths to provide an electric voltage detection signal that is processed by a processing unit (UT) to provide a measurement signa...

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Bibliographische Detailangaben

1. Verfasser:	JOFFRE PASCAL YVON
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS MEASURING MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR PHYSICS TARIFF METERING APPARATUS TESTING
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