DISPOSITIF DE DETECTION D'ANGLE DE ROTATION, DISPOSITIF DE DETECTION DE COUPLE ET PROCEDE DE FABRICATION AFFERENT
A rotation angle detecting device and a torque detecting device, which can prevent waveforms to be outputted from a plurality of semiconductor MR elements, from dispersing due to the material difference of a semiconductor wafer. A plurality of semiconductor MR elements are formed over a common cell...
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| creator | TOKUMOTO YOSHITOMO |
| description | A rotation angle detecting device and a torque detecting device, which can prevent waveforms to be outputted from a plurality of semiconductor MR elements, from dispersing due to the material difference of a semiconductor wafer. A plurality of semiconductor MR elements are formed over a common cell of a semiconductor wafer and are arranged to confront at such positions different from each other in a target circumferential direction with respect to corresponding input and output shafts that signals to be outputted according to the rotations of the input and output shafts to be detected may establish a predetermined phase difference in an electrical angle. |
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A plurality of semiconductor MR elements are formed over a common cell of a semiconductor wafer and are arranged to confront at such positions different from each other in a target circumferential direction with respect to corresponding input and output shafts that signals to be outputted according to the rotations of the input and output shafts to be detected may establish a predetermined phase difference in an electrical angle.</description><language>fre</language><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS ; LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS ; MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE ; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR ; MOTOR VEHICLES ; PERFORMING OPERATIONS ; PHYSICS ; TARIFF METERING APPARATUS ; TESTING ; TRAILERS ; TRANSPORTING</subject><creationdate>2006</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060602&DB=EPODOC&CC=FR&NR=2846411B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20060602&DB=EPODOC&CC=FR&NR=2846411B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TOKUMOTO YOSHITOMO</creatorcontrib><title>DISPOSITIF DE DETECTION D'ANGLE DE ROTATION, DISPOSITIF DE DETECTION DE COUPLE ET PROCEDE DE FABRICATION AFFERENT</title><description>A rotation angle detecting device and a torque detecting device, which can prevent waveforms to be outputted from a plurality of semiconductor MR elements, from dispersing due to the material difference of a semiconductor wafer. A plurality of semiconductor MR elements are formed over a common cell of a semiconductor wafer and are arranged to confront at such positions different from each other in a target circumferential direction with respect to corresponding input and output shafts that signals to be outputted according to the rotations of the input and output shafts to be detected may establish a predetermined phase difference in an electrical angle.</description><subject>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</subject><subject>LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS</subject><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</subject><subject>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</subject><subject>MOTOR VEHICLES</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>TARIFF METERING APPARATUS</subject><subject>TESTING</subject><subject>TRAILERS</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2006</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZCh08QwO8A_2DPF0U3BxBaIQV-cQT38_BRd1Rz93H5CIQpB_iCNITEcBp2JXBWf_0ACgctcQhYAgf2dXsLSCm6NTkKczWLOCo5uba5CrXwgPA2taYk5xKi-U5mZQcHMNcfbQTS3Ij08tLkhMTs1LLYl3CzKyMDEzMTR0MjQmQgkAP0I3AQ</recordid><startdate>20060602</startdate><enddate>20060602</enddate><creator>TOKUMOTO YOSHITOMO</creator><scope>EVB</scope></search><sort><creationdate>20060602</creationdate><title>DISPOSITIF DE DETECTION D'ANGLE DE ROTATION, DISPOSITIF DE DETECTION DE COUPLE ET PROCEDE DE FABRICATION AFFERENT</title><author>TOKUMOTO YOSHITOMO</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_FR2846411B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>fre</language><creationdate>2006</creationdate><topic>ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS</topic><topic>LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS</topic><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE</topic><topic>MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR</topic><topic>MOTOR VEHICLES</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>TARIFF METERING APPARATUS</topic><topic>TESTING</topic><topic>TRAILERS</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TOKUMOTO YOSHITOMO</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TOKUMOTO YOSHITOMO</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DISPOSITIF DE DETECTION D'ANGLE DE ROTATION, DISPOSITIF DE DETECTION DE COUPLE ET PROCEDE DE FABRICATION AFFERENT</title><date>2006-06-02</date><risdate>2006</risdate><abstract>A rotation angle detecting device and a torque detecting device, which can prevent waveforms to be outputted from a plurality of semiconductor MR elements, from dispersing due to the material difference of a semiconductor wafer. A plurality of semiconductor MR elements are formed over a common cell of a semiconductor wafer and are arranged to confront at such positions different from each other in a target circumferential direction with respect to corresponding input and output shafts that signals to be outputted according to the rotations of the input and output shafts to be detected may establish a predetermined phase difference in an electrical angle.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MOTOR VEHICLES PERFORMING OPERATIONS PHYSICS TARIFF METERING APPARATUS TESTING TRAILERS TRANSPORTING |
| title | DISPOSITIF DE DETECTION D'ANGLE DE ROTATION, DISPOSITIF DE DETECTION DE COUPLE ET PROCEDE DE FABRICATION AFFERENT |
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