DISPOSITIF DE DETECTION D'ANGLE DE ROTATION, DISPOSITIF DE DETECTION DE COUPLE ET PROCEDE DE FABRICATION AFFERENT

A rotation angle detecting device and a torque detecting device, which can prevent waveforms to be outputted from a plurality of semiconductor MR elements, from dispersing due to the material difference of a semiconductor wafer. A plurality of semiconductor MR elements are formed over a common cell...

Ausführliche Beschreibung

Gespeichert in:

Bibliographische Detailangaben
1. Verfasser:	TOKUMOTO YOSHITOMO
Format:	Patent
Sprache:	fre
Schlagworte:	ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVEREDIN A SINGLE OTHER SUBCLASS LAND VEHICLES FOR TRAVELLING OTHERWISE THAN ON RAILS MEASURING MEASURING ANGLES MEASURING AREAS MEASURING FORCE, STRESS, TORQUE, WORK, MECHANICAL POWER,MECHANICAL EFFICIENCY, OR FLUID PRESSURE MEASURING IRREGULARITIES OF SURFACES OR CONTOURS MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR MOTOR VEHICLES PERFORMING OPERATIONS PHYSICS TARIFF METERING APPARATUS TESTING TRAILERS TRANSPORTING
Online-Zugang:	Volltext bestellen
Tags:	Tag hinzufügen Keine Tags, Fügen Sie den ersten Tag hinzu!

Beschreibung
Zusammenfassung:	A rotation angle detecting device and a torque detecting device, which can prevent waveforms to be outputted from a plurality of semiconductor MR elements, from dispersing due to the material difference of a semiconductor wafer. A plurality of semiconductor MR elements are formed over a common cell of a semiconductor wafer and are arranged to confront at such positions different from each other in a target circumferential direction with respect to corresponding input and output shafts that signals to be outputted according to the rotations of the input and output shafts to be detected may establish a predetermined phase difference in an electrical angle.