Sample analysis using secondary electron emission - formed after scanning with monokinetic primary electrons by monokintic primary electron beam

In the elementary and chemical analysis of a sample by spectral analysis of the energies of secondary electrons emitted by the sample when subjected to the action of a monokinetic beam of primary electrons concentrated on its surface, (a) the intensity of the beam of primary monokinetic electrons em...

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Bibliographische Detailangaben

1. Verfasser:	CLAUDE LE GRESSUS, DANIEL MASSIGNON ET RENE SOPIZET
Format:	Patent
Sprache:	eng ; fre
Schlagworte:	BASIC ELECTRIC ELEMENTS ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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