Menetelmä ja laite massan tiheysjakauman määrittämiseksi

Distribution of mass density of paper or other materials is determined by irradiating a sample (7) with a burst of electron beams from an electron gun (1). The intensity levels of electron beams emerging from said sample (7) are detected by an areal detector located immediately behind the sample (7)...

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Hauptverfasser:	TOMIMASU,HIROSHI, LUNER,PHILIP
Format:	Patent
Sprache:	fin ; swe
Schlagworte:	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
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creator	TOMIMASU,HIROSHI LUNER,PHILIP
description	Distribution of mass density of paper or other materials is determined by irradiating a sample (7) with a burst of electron beams from an electron gun (1). The intensity levels of electron beams emerging from said sample (7) are detected by an areal detector located immediately behind the sample (7). These intensity levels are processed to derive distribution of mass density information for the sample (7). The electron beam detector may be a photographic film (8) or a real-time electron beam detector assembly (9) coupled to computer controlled digital data processing and displaying equipment.
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subjects	APPLICATIONS OF SCANNING-PROBE TECHNIQUES, e.g. SCANNING PROBEMICROSCOPY [SPM] INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SCANNING-PROBE TECHNIQUES OR APPARATUS TESTING
title	Menetelmä ja laite massan tiheysjakauman määrittämiseksi
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