Spectrophotometer (Machine-translation by Google Translate, not legally binding)
Spectrophotometer A spectrophotometer is disclosed, in particular, to a spectrophotometer capable of simultaneous analysis in different points of the same sample (4) having a high spatial resolution and without requiring a mechanical physical scanning system throughout the sample. This is achieved b...
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creator | RUZ MARTINEZ, JOSE JAIME TAMAYO DE MIGUEL, FCO. JAVIER PINI, VALERIO ENCINAR DEL POZO, MARIO MONTEIRO KOSAKA, PRISCILA CALLEJA GOMEZ, MONTSERRAT MALVAR VIDAL, OSCAR RAMOS VEGA, DANIEL |
description | Spectrophotometer A spectrophotometer is disclosed, in particular, to a spectrophotometer capable of simultaneous analysis in different points of the same sample (4) having a high spatial resolution and without requiring a mechanical physical scanning system throughout the sample. This is achieved by arranging means for processing the light received by the photodetectors (5), said processing means having a correlation in which each of the photodetectors (5) corresponds to a spatial point of the sample (4). The present invention guarantees in the case of darkfield applications the normalization of the data using the same measurement. (Machine-translation by Google Translate, not legally binding)
Espectrofotómetro. Se da a conocer un espectrofotómetro, en particular, a un espectrofotómetro con capacidad de análisis simultáneo en diferentes puntos de una misma muestra (4) disponiendo de una alta resolución espacial y sin requerir un sistema mecánico de barrido físico a lo largo de la muestra. Esto se consigue mediante la disposición de medios de procesamiento de la luz recibida por los fotodetectores (5) disponiendo dichos medios de procesamiento de una correlación en la que cada uno de los fotodetectores (5) corresponde a un punto espacial de la muestra (4). La presente invención garantiza en el caso de aplicaciones de campo oscuro la normalización de los datos utilizando la misma medida. |
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Espectrofotómetro. Se da a conocer un espectrofotómetro, en particular, a un espectrofotómetro con capacidad de análisis simultáneo en diferentes puntos de una misma muestra (4) disponiendo de una alta resolución espacial y sin requerir un sistema mecánico de barrido físico a lo largo de la muestra. Esto se consigue mediante la disposición de medios de procesamiento de la luz recibida por los fotodetectores (5) disponiendo dichos medios de procesamiento de una correlación en la que cada uno de los fotodetectores (5) corresponde a un punto espacial de la muestra (4). La presente invención garantiza en el caso de aplicaciones de campo oscuro la normalización de los datos utilizando la misma medida.</description><language>eng ; spa</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2016</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160511&DB=EPODOC&CC=ES&NR=2569550A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20160511&DB=EPODOC&CC=ES&NR=2569550A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>RUZ MARTINEZ, JOSE JAIME</creatorcontrib><creatorcontrib>TAMAYO DE MIGUEL, FCO. JAVIER</creatorcontrib><creatorcontrib>PINI, VALERIO</creatorcontrib><creatorcontrib>ENCINAR DEL POZO, MARIO</creatorcontrib><creatorcontrib>MONTEIRO KOSAKA, PRISCILA</creatorcontrib><creatorcontrib>CALLEJA GOMEZ, MONTSERRAT</creatorcontrib><creatorcontrib>MALVAR VIDAL, OSCAR</creatorcontrib><creatorcontrib>RAMOS VEGA, DANIEL</creatorcontrib><title>Spectrophotometer (Machine-translation by Google Translate, not legally binding)</title><description>Spectrophotometer A spectrophotometer is disclosed, in particular, to a spectrophotometer capable of simultaneous analysis in different points of the same sample (4) having a high spatial resolution and without requiring a mechanical physical scanning system throughout the sample. This is achieved by arranging means for processing the light received by the photodetectors (5), said processing means having a correlation in which each of the photodetectors (5) corresponds to a spatial point of the sample (4). The present invention guarantees in the case of darkfield applications the normalization of the data using the same measurement. (Machine-translation by Google Translate, not legally binding)
Espectrofotómetro. Se da a conocer un espectrofotómetro, en particular, a un espectrofotómetro con capacidad de análisis simultáneo en diferentes puntos de una misma muestra (4) disponiendo de una alta resolución espacial y sin requerir un sistema mecánico de barrido físico a lo largo de la muestra. Esto se consigue mediante la disposición de medios de procesamiento de la luz recibida por los fotodetectores (5) disponiendo dichos medios de procesamiento de una correlación en la que cada uno de los fotodetectores (5) corresponde a un punto espacial de la muestra (4). La presente invención garantiza en el caso de aplicaciones de campo oscuro la normalización de los datos utilizando la misma medida.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2016</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNyr8KwjAQgPEsDqK-w40KFvxDBEeRqosgtHtJ45kGzruQ3NK3d-kDOH3w45ubV5PQa5Y0iMoXFTOsn84PkbHS7LiQ0ygM_Qh3kUAI7aS4BRYFwuCIRugjvyOHzdLMPo4KrqYuDNzq9vqoMEmHJTmPjNrVzcGeztbuLvvjH8sPRTU29g</recordid><startdate>20160511</startdate><enddate>20160511</enddate><creator>RUZ MARTINEZ, JOSE JAIME</creator><creator>TAMAYO DE MIGUEL, FCO. JAVIER</creator><creator>PINI, VALERIO</creator><creator>ENCINAR DEL POZO, MARIO</creator><creator>MONTEIRO KOSAKA, PRISCILA</creator><creator>CALLEJA GOMEZ, MONTSERRAT</creator><creator>MALVAR VIDAL, OSCAR</creator><creator>RAMOS VEGA, DANIEL</creator><scope>EVB</scope></search><sort><creationdate>20160511</creationdate><title>Spectrophotometer (Machine-translation by Google Translate, not legally binding)</title><author>RUZ MARTINEZ, JOSE JAIME ; TAMAYO DE MIGUEL, FCO. JAVIER ; PINI, VALERIO ; ENCINAR DEL POZO, MARIO ; MONTEIRO KOSAKA, PRISCILA ; CALLEJA GOMEZ, MONTSERRAT ; MALVAR VIDAL, OSCAR ; RAMOS VEGA, DANIEL</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_ES2569550A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; spa</language><creationdate>2016</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>RUZ MARTINEZ, JOSE JAIME</creatorcontrib><creatorcontrib>TAMAYO DE MIGUEL, FCO. JAVIER</creatorcontrib><creatorcontrib>PINI, VALERIO</creatorcontrib><creatorcontrib>ENCINAR DEL POZO, MARIO</creatorcontrib><creatorcontrib>MONTEIRO KOSAKA, PRISCILA</creatorcontrib><creatorcontrib>CALLEJA GOMEZ, MONTSERRAT</creatorcontrib><creatorcontrib>MALVAR VIDAL, OSCAR</creatorcontrib><creatorcontrib>RAMOS VEGA, DANIEL</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>RUZ MARTINEZ, JOSE JAIME</au><au>TAMAYO DE MIGUEL, FCO. JAVIER</au><au>PINI, VALERIO</au><au>ENCINAR DEL POZO, MARIO</au><au>MONTEIRO KOSAKA, PRISCILA</au><au>CALLEJA GOMEZ, MONTSERRAT</au><au>MALVAR VIDAL, OSCAR</au><au>RAMOS VEGA, DANIEL</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>Spectrophotometer (Machine-translation by Google Translate, not legally binding)</title><date>2016-05-11</date><risdate>2016</risdate><abstract>Spectrophotometer A spectrophotometer is disclosed, in particular, to a spectrophotometer capable of simultaneous analysis in different points of the same sample (4) having a high spatial resolution and without requiring a mechanical physical scanning system throughout the sample. This is achieved by arranging means for processing the light received by the photodetectors (5), said processing means having a correlation in which each of the photodetectors (5) corresponds to a spatial point of the sample (4). The present invention guarantees in the case of darkfield applications the normalization of the data using the same measurement. (Machine-translation by Google Translate, not legally binding)
Espectrofotómetro. Se da a conocer un espectrofotómetro, en particular, a un espectrofotómetro con capacidad de análisis simultáneo en diferentes puntos de una misma muestra (4) disponiendo de una alta resolución espacial y sin requerir un sistema mecánico de barrido físico a lo largo de la muestra. Esto se consigue mediante la disposición de medios de procesamiento de la luz recibida por los fotodetectores (5) disponiendo dichos medios de procesamiento de una correlación en la que cada uno de los fotodetectores (5) corresponde a un punto espacial de la muestra (4). La presente invención garantiza en el caso de aplicaciones de campo oscuro la normalización de los datos utilizando la misma medida.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | Spectrophotometer (Machine-translation by Google Translate, not legally binding) |
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