System and procedure for measuring the ruggedness of a paper sample by analysis of the speckle texture pattern (Machine-translation by Google Translate, not legally binding)

System and procedure for measuring the roughness of a paper sample by analyzing the texture pattern of the speckle. System for measuring the roughness of a sample (2) of paper, which with a laser (1) and a beam expander (11) at an angle and distance determined with respect to the sample (3), a digit...

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Hauptverfasser: TOSAS FUENTES, AGUSTIN, OSVAN PINO, ABDIEL, PLADELLORENS MALLOFRE, JOSEP, CUSOLA AUMEDES, ORIOL, CAUM AREGAY, JESUS
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creator TOSAS FUENTES, AGUSTIN
OSVAN PINO, ABDIEL
PLADELLORENS MALLOFRE, JOSEP
CUSOLA AUMEDES, ORIOL
CAUM AREGAY, JESUS
description System and procedure for measuring the roughness of a paper sample by analyzing the texture pattern of the speckle. System for measuring the roughness of a sample (2) of paper, which with a laser (1) and a beam expander (11) at an angle and distance determined with respect to the sample (3), a digital camera (3) in the direction normal to the sample (2), a processing device (4) with an adapter, and with at least one power supply. Method for measuring the roughness of a sample (2) of paper, comprising the following steps (a) a laser beam is projected and expanded on a sample (3) (b) a camera (3) captures the image, obtaining a speckle pattern (c) the camera (3) sends said speckle pattern to the processing device (4) (d) the processing device (4) obtains the roughness parameter of the sample (2) through a descriptor of the co-occurrence matrix of gray levels. (Machine-translation by Google Translate, not legally binding) Sistema y procedimiento para la medida de la rugosidad de una muestra de papel mediante el análisis del patrón de textura del speckle. Sistema para la medida de la rugosidad de una muestra (2) de papel, que con un láser (1) y un expansor del haz (11) en ángulo y distancia determinada respecto a la muestra (3), una cámara (3) digital en dirección normal a la muestra (2), un dispositivo de procesado (4) con un adaptador, y con al menos una fuente de alimentación. Procedimiento para la medida de la rugosidad de una muestra (2) de papel, que comprende las siguientes etapas (a) se proyecta y expande un haz láser sobre una muestra (3) (b) una cámara (3) capta la imagen, obteniendo un patrón de speckle (c) la cámara (3) envía dicho patrón de speckle al dispositivo de procesado (4) (d) el dispositivo de procesado (4) obtiene el parámetro de rugosidad de la muestra (2) a través de un descriptor de la matriz de co-ocurrencia de niveles gris.
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System for measuring the roughness of a sample (2) of paper, which with a laser (1) and a beam expander (11) at an angle and distance determined with respect to the sample (3), a digital camera (3) in the direction normal to the sample (2), a processing device (4) with an adapter, and with at least one power supply. Method for measuring the roughness of a sample (2) of paper, comprising the following steps (a) a laser beam is projected and expanded on a sample (3) (b) a camera (3) captures the image, obtaining a speckle pattern (c) the camera (3) sends said speckle pattern to the processing device (4) (d) the processing device (4) obtains the roughness parameter of the sample (2) through a descriptor of the co-occurrence matrix of gray levels. (Machine-translation by Google Translate, not legally binding) Sistema y procedimiento para la medida de la rugosidad de una muestra de papel mediante el análisis del patrón de textura del speckle. Sistema para la medida de la rugosidad de una muestra (2) de papel, que con un láser (1) y un expansor del haz (11) en ángulo y distancia determinada respecto a la muestra (3), una cámara (3) digital en dirección normal a la muestra (2), un dispositivo de procesado (4) con un adaptador, y con al menos una fuente de alimentación. Procedimiento para la medida de la rugosidad de una muestra (2) de papel, que comprende las siguientes etapas (a) se proyecta y expande un haz láser sobre una muestra (3) (b) una cámara (3) capta la imagen, obteniendo un patrón de speckle (c) la cámara (3) envía dicho patrón de speckle al dispositivo de procesado (4) (d) el dispositivo de procesado (4) obtiene el parámetro de rugosidad de la muestra (2) a través de un descriptor de la matriz de co-ocurrencia de niveles gris.</description><language>eng ; spa</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130415&amp;DB=EPODOC&amp;CC=ES&amp;NR=2400891A2$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20130415&amp;DB=EPODOC&amp;CC=ES&amp;NR=2400891A2$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TOSAS FUENTES, AGUSTIN</creatorcontrib><creatorcontrib>OSVAN PINO, ABDIEL</creatorcontrib><creatorcontrib>PLADELLORENS MALLOFRE, JOSEP</creatorcontrib><creatorcontrib>CUSOLA AUMEDES, ORIOL</creatorcontrib><creatorcontrib>CAUM AREGAY, JESUS</creatorcontrib><title>System and procedure for measuring the ruggedness of a paper sample by analysis of the speckle texture pattern (Machine-translation by Google Translate, not legally binding)</title><description>System and procedure for measuring the roughness of a paper sample by analyzing the texture pattern of the speckle. System for measuring the roughness of a sample (2) of paper, which with a laser (1) and a beam expander (11) at an angle and distance determined with respect to the sample (3), a digital camera (3) in the direction normal to the sample (2), a processing device (4) with an adapter, and with at least one power supply. Method for measuring the roughness of a sample (2) of paper, comprising the following steps (a) a laser beam is projected and expanded on a sample (3) (b) a camera (3) captures the image, obtaining a speckle pattern (c) the camera (3) sends said speckle pattern to the processing device (4) (d) the processing device (4) obtains the roughness parameter of the sample (2) through a descriptor of the co-occurrence matrix of gray levels. (Machine-translation by Google Translate, not legally binding) Sistema y procedimiento para la medida de la rugosidad de una muestra de papel mediante el análisis del patrón de textura del speckle. Sistema para la medida de la rugosidad de una muestra (2) de papel, que con un láser (1) y un expansor del haz (11) en ángulo y distancia determinada respecto a la muestra (3), una cámara (3) digital en dirección normal a la muestra (2), un dispositivo de procesado (4) con un adaptador, y con al menos una fuente de alimentación. Procedimiento para la medida de la rugosidad de una muestra (2) de papel, que comprende las siguientes etapas (a) se proyecta y expande un haz láser sobre una muestra (3) (b) una cámara (3) capta la imagen, obteniendo un patrón de speckle (c) la cámara (3) envía dicho patrón de speckle al dispositivo de procesado (4) (d) el dispositivo de procesado (4) obtiene el parámetro de rugosidad de la muestra (2) a través de un descriptor de la matriz de co-ocurrencia de niveles gris.</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjrFuwkAQRN1QIMI_bBkkkAhQhBIhSJpU0KPFHh8nznun27WEPyr_GDviA6hGmnkzmnHxe-rU0BBLRSnHElWbQXXM1IC1zV4c2Q2UW-dQCVQp1sSUOCGTcpMC6Nr1fQ6d-v904DWhvPeR4WHDYmIzZKH3Hy5vXrCwzKKBzUcZ-l8xuh4_P13MSaJRgOMQOrp6qfons7diVHNQTJ86Keh4OO-_F0jxAk1cQmCXw2m1WS4_tx-71foF5A9K2llk</recordid><startdate>20130415</startdate><enddate>20130415</enddate><creator>TOSAS FUENTES, AGUSTIN</creator><creator>OSVAN PINO, ABDIEL</creator><creator>PLADELLORENS MALLOFRE, JOSEP</creator><creator>CUSOLA AUMEDES, ORIOL</creator><creator>CAUM AREGAY, JESUS</creator><scope>EVB</scope></search><sort><creationdate>20130415</creationdate><title>System and procedure for measuring the ruggedness of a paper sample by analysis of the speckle texture pattern (Machine-translation by Google Translate, not legally binding)</title><author>TOSAS FUENTES, AGUSTIN ; OSVAN PINO, ABDIEL ; PLADELLORENS MALLOFRE, JOSEP ; CUSOLA AUMEDES, ORIOL ; CAUM AREGAY, JESUS</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_ES2400891A23</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; spa</language><creationdate>2013</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TOSAS FUENTES, AGUSTIN</creatorcontrib><creatorcontrib>OSVAN PINO, ABDIEL</creatorcontrib><creatorcontrib>PLADELLORENS MALLOFRE, JOSEP</creatorcontrib><creatorcontrib>CUSOLA AUMEDES, ORIOL</creatorcontrib><creatorcontrib>CAUM AREGAY, JESUS</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TOSAS FUENTES, AGUSTIN</au><au>OSVAN PINO, ABDIEL</au><au>PLADELLORENS MALLOFRE, JOSEP</au><au>CUSOLA AUMEDES, ORIOL</au><au>CAUM AREGAY, JESUS</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>System and procedure for measuring the ruggedness of a paper sample by analysis of the speckle texture pattern (Machine-translation by Google Translate, not legally binding)</title><date>2013-04-15</date><risdate>2013</risdate><abstract>System and procedure for measuring the roughness of a paper sample by analyzing the texture pattern of the speckle. System for measuring the roughness of a sample (2) of paper, which with a laser (1) and a beam expander (11) at an angle and distance determined with respect to the sample (3), a digital camera (3) in the direction normal to the sample (2), a processing device (4) with an adapter, and with at least one power supply. Method for measuring the roughness of a sample (2) of paper, comprising the following steps (a) a laser beam is projected and expanded on a sample (3) (b) a camera (3) captures the image, obtaining a speckle pattern (c) the camera (3) sends said speckle pattern to the processing device (4) (d) the processing device (4) obtains the roughness parameter of the sample (2) through a descriptor of the co-occurrence matrix of gray levels. (Machine-translation by Google Translate, not legally binding) Sistema y procedimiento para la medida de la rugosidad de una muestra de papel mediante el análisis del patrón de textura del speckle. Sistema para la medida de la rugosidad de una muestra (2) de papel, que con un láser (1) y un expansor del haz (11) en ángulo y distancia determinada respecto a la muestra (3), una cámara (3) digital en dirección normal a la muestra (2), un dispositivo de procesado (4) con un adaptador, y con al menos una fuente de alimentación. Procedimiento para la medida de la rugosidad de una muestra (2) de papel, que comprende las siguientes etapas (a) se proyecta y expande un haz láser sobre una muestra (3) (b) una cámara (3) capta la imagen, obteniendo un patrón de speckle (c) la cámara (3) envía dicho patrón de speckle al dispositivo de procesado (4) (d) el dispositivo de procesado (4) obtiene el parámetro de rugosidad de la muestra (2) a través de un descriptor de la matriz de co-ocurrencia de niveles gris.</abstract><oa>free_for_read</oa></addata></record>
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subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title System and procedure for measuring the ruggedness of a paper sample by analysis of the speckle texture pattern (Machine-translation by Google Translate, not legally binding)
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