DISPOSITIVO Y METODO PARA LA DETERMINACION DE CARACTERISTICAS ELECTRICAS DE NANOCONTACTOS ENTRE UNA NANOESTRUCTURA LONGITUDINAL Y UNA PISTA DE METAL PARA SU CONEXIONADO
Device and method for the determination of electrical characteristics of nanocontacts between a longitudinal nanostructure and a metal track for its connection. The device and method object of the invention make it possible to determine the contact resistance of a nanocontact between a longitudinal...
Gespeichert in:
Hauptverfasser: | , , , , , , , |
---|---|
Format: | Patent |
Sprache: | spa |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | SABATE VIZCARRA, NEUS IVANOV, PETER FIGUERAS COSTA, EDUARD GRACIA TORTADES, ISABEL CANE BALLART, CARLES FONSECA CHACHARO, LUIS SANTANDER VALLEJO, JOAQUIN TORRES HERRERO, NURIA |
description | Device and method for the determination of electrical characteristics of nanocontacts between a longitudinal nanostructure and a metal track for its connection. The device and method object of the invention make it possible to determine the contact resistance of a nanocontact between a longitudinal nanostructure and a metal track to characterize said nanocontact and to be able to estimate its connection without damaging the nanostructure and without the measurement being affected by the influence of parasitic resistances. (Machine-translation by Google Translate, not legally binding) |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_ES2381506B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>ES2381506B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_ES2381506B13</originalsourceid><addsrcrecordid>eNqNjkEKwjAQRbtxIeod5gKCtShuYzJqoM2UZCK6KkXiSrRQD-UxnRYP4Gpm_v_8N9PsY2yoKVi2Z4IrVMhkCGrlFZQKDDL6yjqlLTm5QIuhRbOBrVYBsETNflzFdcqRJscSIfEce4To1KhjYB81x6GY3NFyNNJbCnNI1FI44IYHRBz5IYKU4UXQytA8m9zbR58WvznL4ICsT8vUvZrUd-0tPdO7wbAudvlmtd3nxR-RL0VSRuk</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DISPOSITIVO Y METODO PARA LA DETERMINACION DE CARACTERISTICAS ELECTRICAS DE NANOCONTACTOS ENTRE UNA NANOESTRUCTURA LONGITUDINAL Y UNA PISTA DE METAL PARA SU CONEXIONADO</title><source>esp@cenet</source><creator>SABATE VIZCARRA, NEUS ; IVANOV, PETER ; FIGUERAS COSTA, EDUARD ; GRACIA TORTADES, ISABEL ; CANE BALLART, CARLES ; FONSECA CHACHARO, LUIS ; SANTANDER VALLEJO, JOAQUIN ; TORRES HERRERO, NURIA</creator><creatorcontrib>SABATE VIZCARRA, NEUS ; IVANOV, PETER ; FIGUERAS COSTA, EDUARD ; GRACIA TORTADES, ISABEL ; CANE BALLART, CARLES ; FONSECA CHACHARO, LUIS ; SANTANDER VALLEJO, JOAQUIN ; TORRES HERRERO, NURIA</creatorcontrib><description>Device and method for the determination of electrical characteristics of nanocontacts between a longitudinal nanostructure and a metal track for its connection. The device and method object of the invention make it possible to determine the contact resistance of a nanocontact between a longitudinal nanostructure and a metal track to characterize said nanocontact and to be able to estimate its connection without damaging the nanostructure and without the measurement being affected by the influence of parasitic resistances. (Machine-translation by Google Translate, not legally binding)</description><language>spa</language><subject>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES ; MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; NANOTECHNOLOGY ; PERFORMING OPERATIONS ; PHYSICS ; SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES ; TESTING ; TRANSPORTING</subject><creationdate>2013</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130506&DB=EPODOC&CC=ES&NR=2381506B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,778,883,25551,76302</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20130506&DB=EPODOC&CC=ES&NR=2381506B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SABATE VIZCARRA, NEUS</creatorcontrib><creatorcontrib>IVANOV, PETER</creatorcontrib><creatorcontrib>FIGUERAS COSTA, EDUARD</creatorcontrib><creatorcontrib>GRACIA TORTADES, ISABEL</creatorcontrib><creatorcontrib>CANE BALLART, CARLES</creatorcontrib><creatorcontrib>FONSECA CHACHARO, LUIS</creatorcontrib><creatorcontrib>SANTANDER VALLEJO, JOAQUIN</creatorcontrib><creatorcontrib>TORRES HERRERO, NURIA</creatorcontrib><title>DISPOSITIVO Y METODO PARA LA DETERMINACION DE CARACTERISTICAS ELECTRICAS DE NANOCONTACTOS ENTRE UNA NANOESTRUCTURA LONGITUDINAL Y UNA PISTA DE METAL PARA SU CONEXIONADO</title><description>Device and method for the determination of electrical characteristics of nanocontacts between a longitudinal nanostructure and a metal track for its connection. The device and method object of the invention make it possible to determine the contact resistance of a nanocontact between a longitudinal nanostructure and a metal track to characterize said nanocontact and to be able to estimate its connection without damaging the nanostructure and without the measurement being affected by the influence of parasitic resistances. (Machine-translation by Google Translate, not legally binding)</description><subject>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</subject><subject>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>NANOTECHNOLOGY</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</subject><subject>TESTING</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2013</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjkEKwjAQRbtxIeod5gKCtShuYzJqoM2UZCK6KkXiSrRQD-UxnRYP4Gpm_v_8N9PsY2yoKVi2Z4IrVMhkCGrlFZQKDDL6yjqlLTm5QIuhRbOBrVYBsETNflzFdcqRJscSIfEce4To1KhjYB81x6GY3NFyNNJbCnNI1FI44IYHRBz5IYKU4UXQytA8m9zbR58WvznL4ICsT8vUvZrUd-0tPdO7wbAudvlmtd3nxR-RL0VSRuk</recordid><startdate>20130506</startdate><enddate>20130506</enddate><creator>SABATE VIZCARRA, NEUS</creator><creator>IVANOV, PETER</creator><creator>FIGUERAS COSTA, EDUARD</creator><creator>GRACIA TORTADES, ISABEL</creator><creator>CANE BALLART, CARLES</creator><creator>FONSECA CHACHARO, LUIS</creator><creator>SANTANDER VALLEJO, JOAQUIN</creator><creator>TORRES HERRERO, NURIA</creator><scope>EVB</scope></search><sort><creationdate>20130506</creationdate><title>DISPOSITIVO Y METODO PARA LA DETERMINACION DE CARACTERISTICAS ELECTRICAS DE NANOCONTACTOS ENTRE UNA NANOESTRUCTURA LONGITUDINAL Y UNA PISTA DE METAL PARA SU CONEXIONADO</title><author>SABATE VIZCARRA, NEUS ; IVANOV, PETER ; FIGUERAS COSTA, EDUARD ; GRACIA TORTADES, ISABEL ; CANE BALLART, CARLES ; FONSECA CHACHARO, LUIS ; SANTANDER VALLEJO, JOAQUIN ; TORRES HERRERO, NURIA</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_ES2381506B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>spa</language><creationdate>2013</creationdate><topic>MANUFACTURE OR TREATMENT OF NANOSTRUCTURES</topic><topic>MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>NANOTECHNOLOGY</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES</topic><topic>TESTING</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SABATE VIZCARRA, NEUS</creatorcontrib><creatorcontrib>IVANOV, PETER</creatorcontrib><creatorcontrib>FIGUERAS COSTA, EDUARD</creatorcontrib><creatorcontrib>GRACIA TORTADES, ISABEL</creatorcontrib><creatorcontrib>CANE BALLART, CARLES</creatorcontrib><creatorcontrib>FONSECA CHACHARO, LUIS</creatorcontrib><creatorcontrib>SANTANDER VALLEJO, JOAQUIN</creatorcontrib><creatorcontrib>TORRES HERRERO, NURIA</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SABATE VIZCARRA, NEUS</au><au>IVANOV, PETER</au><au>FIGUERAS COSTA, EDUARD</au><au>GRACIA TORTADES, ISABEL</au><au>CANE BALLART, CARLES</au><au>FONSECA CHACHARO, LUIS</au><au>SANTANDER VALLEJO, JOAQUIN</au><au>TORRES HERRERO, NURIA</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DISPOSITIVO Y METODO PARA LA DETERMINACION DE CARACTERISTICAS ELECTRICAS DE NANOCONTACTOS ENTRE UNA NANOESTRUCTURA LONGITUDINAL Y UNA PISTA DE METAL PARA SU CONEXIONADO</title><date>2013-05-06</date><risdate>2013</risdate><abstract>Device and method for the determination of electrical characteristics of nanocontacts between a longitudinal nanostructure and a metal track for its connection. The device and method object of the invention make it possible to determine the contact resistance of a nanocontact between a longitudinal nanostructure and a metal track to characterize said nanocontact and to be able to estimate its connection without damaging the nanostructure and without the measurement being affected by the influence of parasitic resistances. (Machine-translation by Google Translate, not legally binding)</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | spa |
recordid | cdi_epo_espacenet_ES2381506B1 |
source | esp@cenet |
subjects | MANUFACTURE OR TREATMENT OF NANOSTRUCTURES MEASUREMENT OR ANALYSIS OF NANOSTRUCTURES MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES NANOTECHNOLOGY PERFORMING OPERATIONS PHYSICS SPECIFIC USES OR APPLICATIONS OF NANOSTRUCTURES TESTING TRANSPORTING |
title | DISPOSITIVO Y METODO PARA LA DETERMINACION DE CARACTERISTICAS ELECTRICAS DE NANOCONTACTOS ENTRE UNA NANOESTRUCTURA LONGITUDINAL Y UNA PISTA DE METAL PARA SU CONEXIONADO |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-15T21%3A50%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SABATE%20VIZCARRA,%20NEUS&rft.date=2013-05-06&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EES2381506B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |