METHOD FOR CONTROLLING MASS SPECTROMETER, AND MASS SPECTROMETER

An object of the present disclosure is to provide a method for controlling a mass analyzer. According to the method, sensitivity reduction in a high ion concentration region can be prevented without changing a dwell time for each data point. In the method for controlling a mass analyzer according to...

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Bibliographische Detailangaben
Hauptverfasser: TOMA, Tsugunao, HASHIMOTO, Yuichiro, SUGIYAMA, Masuyuki, TAMURA, Riku, YASUDA, Hiroyuki
Format: Patent
Sprache:eng ; fre ; ger
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