MATERIAL IMAGING SYSTEM AND METHOD

MATERIAL IMAGING SYSTEM AND METHOD

An imaging system 100 for earthen material 102 includes a support structure 104 adjacent an image location 106 for a pathway of earthen material exposed to varying and uncontrolled illumination 140 and optionally also to artificial illumination from an optional artificial illumination source 154 of...

Ausführliche Beschreibung

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Bibliographische Detailangaben
Hauptverfasser: ALHUMSI, Obada, MCKINLEY, Timothy A
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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Beschreibung
Zusammenfassung:An imaging system 100 for earthen material 102 includes a support structure 104 adjacent an image location 106 for a pathway of earthen material exposed to varying and uncontrolled illumination 140 and optionally also to artificial illumination from an optional artificial illumination source 154 of the system, a spectral imager 108, and a reference device 149 each mounted to the support structure, wherein the spectral imager directed at the image location and arranged to measure an intensity of illumination reflected from earthen material at the image location.