METHOD FOR GENERATING DATA FOR PARTICLE ANALYSIS, PROGRAM FOR GENERATING DATA FOR PARTICLE ANALYSIS, AND DEVICE FOR GENERATING DATA FOR PARTICLE ANALYSIS

METHOD FOR GENERATING DATA FOR PARTICLE ANALYSIS, PROGRAM FOR GENERATING DATA FOR PARTICLE ANALYSIS, AND DEVICE FOR GENERATING DATA FOR PARTICLE ANALYSIS

In relation to application of artificial intelligence to image analysis of particles, to make it possible to provide data for machine learning corresponding to user demands while making it possible to reduce, as much as possible, man-hours taken to, for example, prepare vast amounts of actual image...

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Hauptverfasser: KOSHIKAWA, Hiroyuki, NAKATANI, Hitoshi, MATSUO, Kosuke, MORI, Tetsuya, AKIYAMA, Hisashi, KATSUDA, Toshihiro
Format: Patent
Sprache:eng ; fre ; ger
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator KOSHIKAWA, Hiroyuki
NAKATANI, Hitoshi
MATSUO, Kosuke
MORI, Tetsuya
AKIYAMA, Hisashi
KATSUDA, Toshihiro
description In relation to application of artificial intelligence to image analysis of particles, to make it possible to provide data for machine learning corresponding to user demands while making it possible to reduce, as much as possible, man-hours taken to, for example, prepare vast amounts of actual image data obtained by actually capturing images of particles, the present invention generates virtual particle image data, which is image data of a virtual particle, on the basis of a predetermined condition, generates label data corresponding to the virtual particle, and associates the virtual particle image data with the label data.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title METHOD FOR GENERATING DATA FOR PARTICLE ANALYSIS, PROGRAM FOR GENERATING DATA FOR PARTICLE ANALYSIS, AND DEVICE FOR GENERATING DATA FOR PARTICLE ANALYSIS
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