SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN TRANSPORT DEVICE
Disclosed is a specimen measurement apparatus comprising: a measurement unit configured to suction a specimen from a specimen container and measure the suctioned specimen; and a specimen transport unit configured to transport the specimen container to the measurement unit, wherein the specimen trans...
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| creator | KATSUMI, Hironori INOUE, Taku TADA, Masashi |
| description | Disclosed is a specimen measurement apparatus comprising: a measurement unit configured to suction a specimen from a specimen container and measure the suctioned specimen; and a specimen transport unit configured to transport the specimen container to the measurement unit, wherein the specimen transport unit includes a first transport part including a first placement surface configured to allow a specimen rack to be placed thereon, the first transport part being configured to transport a plurality of the specimen racks, each holding the specimen container, on the first placement surface, and a second transport part disposed above the first transport part and including a second placement surface configured to allow the specimen rack to be placed thereon, the second transport part being configured to transport a plurality of the specimen racks on the second placement surface, and at least one of the first transport part and the second transport part is configured to allow the specimen rack to be taken out therefrom or set thereon by a user in a state where the first placement surface and the second placement surface are located at predetermined positions for transporting the specimen rack. |
| format | Patent |
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| language | eng ; fre ; ger |
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| subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
| title | SPECIMEN MEASUREMENT APPARATUS AND SPECIMEN TRANSPORT DEVICE |
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