SOLID-STATE IMAGING DEVICE, IMAGING DEVICE, AND DISTANCE-MEASURING IMAGING DEVICE
A solid-state imaging apparatus includes a pixel circuit (3), a detection and selection circuit (450), and an AD conversion circuit (26). The pixel circuit (3) outputs a plurality of pixel signals corresponding to mutually different gains or sensitivities. The detection and selection circuit (450) c...
Gespeichert in:
| Hauptverfasser: | , , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre ; ger |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | KITO, Takayasu ABE, Yutaka IKUMA, Makoto |
| description | A solid-state imaging apparatus includes a pixel circuit (3), a detection and selection circuit (450), and an AD conversion circuit (26). The pixel circuit (3) outputs a plurality of pixel signals corresponding to mutually different gains or sensitivities. The detection and selection circuit (450) compares one or more of the plurality of pixel signals with a reference value to generate a signal selection signal (407) that instructs selection of a pixel signal among the plurality of pixel signals. The detection and selection circuit (450) includes a sample and hold circuit (412) that holds the plurality of pixel signals, and selects at least one pixel signal among the plurality of pixel signals held in the sample and hold circuit (412) based on the signal selection signal (407). The detection and selection circuit (450) is arranged in a stage before the AD conversion circuit (26) that AD converts the at least one pixel signal selected. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP4354847A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP4354847A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP4354847A13</originalsourceid><addsrcrecordid>eNrjZAgM9vfxdNENDnEMcVXw9HV09_RzV3BxDfN0dtXB4Dv6uSi4eALV-jm76vq6OgaHBoGkUZXxMLCmJeYUp_JCaW4GBTfXEGcP3dSC_PjU4oLE5NS81JJ41wATY1MTCxNzR0NjIpQAAPtZLmE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SOLID-STATE IMAGING DEVICE, IMAGING DEVICE, AND DISTANCE-MEASURING IMAGING DEVICE</title><source>esp@cenet</source><creator>KITO, Takayasu ; ABE, Yutaka ; IKUMA, Makoto</creator><creatorcontrib>KITO, Takayasu ; ABE, Yutaka ; IKUMA, Makoto</creatorcontrib><description>A solid-state imaging apparatus includes a pixel circuit (3), a detection and selection circuit (450), and an AD conversion circuit (26). The pixel circuit (3) outputs a plurality of pixel signals corresponding to mutually different gains or sensitivities. The detection and selection circuit (450) compares one or more of the plurality of pixel signals with a reference value to generate a signal selection signal (407) that instructs selection of a pixel signal among the plurality of pixel signals. The detection and selection circuit (450) includes a sample and hold circuit (412) that holds the plurality of pixel signals, and selects at least one pixel signal among the plurality of pixel signals held in the sample and hold circuit (412) based on the signal selection signal (407). The detection and selection circuit (450) is arranged in a stage before the AD conversion circuit (26) that AD converts the at least one pixel signal selected.</description><language>eng ; fre ; ger</language><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240417&DB=EPODOC&CC=EP&NR=4354847A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240417&DB=EPODOC&CC=EP&NR=4354847A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>KITO, Takayasu</creatorcontrib><creatorcontrib>ABE, Yutaka</creatorcontrib><creatorcontrib>IKUMA, Makoto</creatorcontrib><title>SOLID-STATE IMAGING DEVICE, IMAGING DEVICE, AND DISTANCE-MEASURING IMAGING DEVICE</title><description>A solid-state imaging apparatus includes a pixel circuit (3), a detection and selection circuit (450), and an AD conversion circuit (26). The pixel circuit (3) outputs a plurality of pixel signals corresponding to mutually different gains or sensitivities. The detection and selection circuit (450) compares one or more of the plurality of pixel signals with a reference value to generate a signal selection signal (407) that instructs selection of a pixel signal among the plurality of pixel signals. The detection and selection circuit (450) includes a sample and hold circuit (412) that holds the plurality of pixel signals, and selects at least one pixel signal among the plurality of pixel signals held in the sample and hold circuit (412) based on the signal selection signal (407). The detection and selection circuit (450) is arranged in a stage before the AD conversion circuit (26) that AD converts the at least one pixel signal selected.</description><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAgM9vfxdNENDnEMcVXw9HV09_RzV3BxDfN0dtXB4Dv6uSi4eALV-jm76vq6OgaHBoGkUZXxMLCmJeYUp_JCaW4GBTfXEGcP3dSC_PjU4oLE5NS81JJ41wATY1MTCxNzR0NjIpQAAPtZLmE</recordid><startdate>20240417</startdate><enddate>20240417</enddate><creator>KITO, Takayasu</creator><creator>ABE, Yutaka</creator><creator>IKUMA, Makoto</creator><scope>EVB</scope></search><sort><creationdate>20240417</creationdate><title>SOLID-STATE IMAGING DEVICE, IMAGING DEVICE, AND DISTANCE-MEASURING IMAGING DEVICE</title><author>KITO, Takayasu ; ABE, Yutaka ; IKUMA, Makoto</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4354847A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2024</creationdate><toplevel>online_resources</toplevel><creatorcontrib>KITO, Takayasu</creatorcontrib><creatorcontrib>ABE, Yutaka</creatorcontrib><creatorcontrib>IKUMA, Makoto</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>KITO, Takayasu</au><au>ABE, Yutaka</au><au>IKUMA, Makoto</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SOLID-STATE IMAGING DEVICE, IMAGING DEVICE, AND DISTANCE-MEASURING IMAGING DEVICE</title><date>2024-04-17</date><risdate>2024</risdate><abstract>A solid-state imaging apparatus includes a pixel circuit (3), a detection and selection circuit (450), and an AD conversion circuit (26). The pixel circuit (3) outputs a plurality of pixel signals corresponding to mutually different gains or sensitivities. The detection and selection circuit (450) compares one or more of the plurality of pixel signals with a reference value to generate a signal selection signal (407) that instructs selection of a pixel signal among the plurality of pixel signals. The detection and selection circuit (450) includes a sample and hold circuit (412) that holds the plurality of pixel signals, and selects at least one pixel signal among the plurality of pixel signals held in the sample and hold circuit (412) based on the signal selection signal (407). The detection and selection circuit (450) is arranged in a stage before the AD conversion circuit (26) that AD converts the at least one pixel signal selected.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre ; ger |
| recordid | cdi_epo_espacenet_EP4354847A1 |
| source | esp@cenet |
| title | SOLID-STATE IMAGING DEVICE, IMAGING DEVICE, AND DISTANCE-MEASURING IMAGING DEVICE |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T18%3A12%3A36IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=KITO,%20Takayasu&rft.date=2024-04-17&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP4354847A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |