INTEGRATED CIRCUIT TESTING
Described is a method for connectivity testing of integrated circuits. The method includes connecting an integrated circuit comprising an internal measurement component and a plurality of connection elements to an automated testing apparatus via a first common test channel connected to a first set o...
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| creator | MYREN, Steinar |
| description | Described is a method for connectivity testing of integrated circuits. The method includes connecting an integrated circuit comprising an internal measurement component and a plurality of connection elements to an automated testing apparatus via a first common test channel connected to a first set of non-neighbouring connection elements of the plurality of connection elements and a second common test channel connected to a second set of non-neighbouring connection elements of the plurality of connection elements, different to the first set of non-neighbouring connection elements. The connection elements of the first set of non-neighbouring connection elements neighbour connection elements of the second set of non-neighbouring connection elements. The method further includes connecting a connection element of the plurality of connection elements to the internal measurement component, testing the connected connection element, and identifying a pass or fail for the connected connection element based on the testing. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP4314846A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP4314846A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP4314846A13</originalsourceid><addsrcrecordid>eNrjZJDy9AtxdQ9yDHF1UXD2DHIO9QxRCHENDvH0c-dhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGuASbGhiYWJmaOhsZEKAEAAIUf_Q</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>INTEGRATED CIRCUIT TESTING</title><source>esp@cenet</source><creator>MYREN, Steinar</creator><creatorcontrib>MYREN, Steinar</creatorcontrib><description>Described is a method for connectivity testing of integrated circuits. The method includes connecting an integrated circuit comprising an internal measurement component and a plurality of connection elements to an automated testing apparatus via a first common test channel connected to a first set of non-neighbouring connection elements of the plurality of connection elements and a second common test channel connected to a second set of non-neighbouring connection elements of the plurality of connection elements, different to the first set of non-neighbouring connection elements. The connection elements of the first set of non-neighbouring connection elements neighbour connection elements of the second set of non-neighbouring connection elements. The method further includes connecting a connection element of the plurality of connection elements to the internal measurement component, testing the connected connection element, and identifying a pass or fail for the connected connection element based on the testing.</description><language>eng ; fre ; ger</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240207&DB=EPODOC&CC=EP&NR=4314846A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240207&DB=EPODOC&CC=EP&NR=4314846A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MYREN, Steinar</creatorcontrib><title>INTEGRATED CIRCUIT TESTING</title><description>Described is a method for connectivity testing of integrated circuits. The method includes connecting an integrated circuit comprising an internal measurement component and a plurality of connection elements to an automated testing apparatus via a first common test channel connected to a first set of non-neighbouring connection elements of the plurality of connection elements and a second common test channel connected to a second set of non-neighbouring connection elements of the plurality of connection elements, different to the first set of non-neighbouring connection elements. The connection elements of the first set of non-neighbouring connection elements neighbour connection elements of the second set of non-neighbouring connection elements. The method further includes connecting a connection element of the plurality of connection elements to the internal measurement component, testing the connected connection element, and identifying a pass or fail for the connected connection element based on the testing.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJDy9AtxdQ9yDHF1UXD2DHIO9QxRCHENDvH0c-dhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGuASbGhiYWJmaOhsZEKAEAAIUf_Q</recordid><startdate>20240207</startdate><enddate>20240207</enddate><creator>MYREN, Steinar</creator><scope>EVB</scope></search><sort><creationdate>20240207</creationdate><title>INTEGRATED CIRCUIT TESTING</title><author>MYREN, Steinar</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4314846A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MYREN, Steinar</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MYREN, Steinar</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INTEGRATED CIRCUIT TESTING</title><date>2024-02-07</date><risdate>2024</risdate><abstract>Described is a method for connectivity testing of integrated circuits. The method includes connecting an integrated circuit comprising an internal measurement component and a plurality of connection elements to an automated testing apparatus via a first common test channel connected to a first set of non-neighbouring connection elements of the plurality of connection elements and a second common test channel connected to a second set of non-neighbouring connection elements of the plurality of connection elements, different to the first set of non-neighbouring connection elements. The connection elements of the first set of non-neighbouring connection elements neighbour connection elements of the second set of non-neighbouring connection elements. The method further includes connecting a connection element of the plurality of connection elements to the internal measurement component, testing the connected connection element, and identifying a pass or fail for the connected connection element based on the testing.</abstract><oa>free_for_read</oa></addata></record> |
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| language | eng ; fre ; ger |
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| subjects | MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING |
| title | INTEGRATED CIRCUIT TESTING |
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