PROBE AND PROBE CARD

PROBE AND PROBE CARD

A probe is inserted into a through-hole in a guide plate and used for inspecting electrical characteristics of an inspection object, and the probe includes: a columnar conductor; and a plurality of insulating coating materials arranged spaced apart from each other on a surface of the conductor along...

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Hauptverfasser: TOYODA, Misaki, KON, Mizuho, HAYASHIZAKI, Takayuki, NASU, Mika, SUTO, Kenichi
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
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creator TOYODA, Misaki
KON, Mizuho
HAYASHIZAKI, Takayuki
NASU, Mika
SUTO, Kenichi
description A probe is inserted into a through-hole in a guide plate and used for inspecting electrical characteristics of an inspection object, and the probe includes: a columnar conductor; and a plurality of insulating coating materials arranged spaced apart from each other on a surface of the conductor along a central axis direction of the conductor.
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language eng ; fre ; ger
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subjects BASIC ELECTRIC ELEMENTS
ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
SEMICONDUCTOR DEVICES
TESTING
title PROBE AND PROBE CARD
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