INTEGRATED MODEL GENERATION METHOD, IMAGE INSPECTION SYSTEM, IMAGE INSPECTION MODEL GENERATION DEVICE, IMAGE INSPECTION MODEL GENERATION PROGRAM, AND IMAGE INSPECTION DEVICE

An inspection model adapted to an environment of a site is generated with a lighter learning workload. A plurality of first element models different from each other in the specific feature are prepared. A second model is generated by adjusting at least one of the plurality of first element models to...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KATO, Yutaka, KURITA, Masashi
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING COUNTING IMAGE DATA PROCESSING OR GENERATION, IN GENERAL INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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