CONTROL METHOD FOR TEST SYSTEM, CONTROL METHOD FOR SMEAR PREPARATION DEVICE, TEST SYSTEM, AND SMEAR PREPARATION DEVICE

CONTROL METHOD FOR TEST SYSTEM, CONTROL METHOD FOR SMEAR PREPARATION DEVICE, TEST SYSTEM, AND SMEAR PREPARATION DEVICE

Disclosed is a control method for a test system including a smear imaging unit configured to image a smear of a specimen, the control method including: preparing a plurality of the smears; sequentially storing, in a storing container capable of storing therein a plurality of the smears, the smears h...

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Hauptverfasser: KAWAKAMI, Daiki, SHINABE, Seiya, ASAHARA, Tomoyuki
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator KAWAKAMI, Daiki
SHINABE, Seiya
ASAHARA, Tomoyuki
description Disclosed is a control method for a test system including a smear imaging unit configured to image a smear of a specimen, the control method including: preparing a plurality of the smears; sequentially storing, in a storing container capable of storing therein a plurality of the smears, the smears having been prepared; and transporting, when information about a standby situation for imaging processing by the smear imaging unit satisfies a predetermined condition, the storing container that stores therein the smears to the smear imaging unit regardless of the number of the smears stored in the storing container.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title CONTROL METHOD FOR TEST SYSTEM, CONTROL METHOD FOR SMEAR PREPARATION DEVICE, TEST SYSTEM, AND SMEAR PREPARATION DEVICE
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