AUTOMATIC ANALYSIS DEVICE AND AUTOMATIC ANALYSIS METHOD

In an automatic analyzer, an influence due to a disturbance component on a measurement result can be appropriately prevented. An automatic analyzer 1 includes: a first light source 102 configured to emit light toward a sample 44; a drive circuit 101 configured to supply a first drive current I3 whos...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	KARO Hikaru, NISHIGAKI Kenichi
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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