INDUCED CROSSTALK CIRCUIT FOR IMPROVED SENSOR LINEARITY
An optical sensor includes a detector having a printed circuit board (PCB) and an inductive loop. The printed circuit board (PCB) has a photodiode cathode pad with a photodiode. The inductive loop is arranged around at least part of the photodiode cathode pad, and configured to receive inductive loo...
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| creator | PARMLEY, Steven M LEISS, Michael POSEY, Douglas J FLANAGAN, Kevin R |
| description | An optical sensor includes a detector having a printed circuit board (PCB) and an inductive loop. The printed circuit board (PCB) has a photodiode cathode pad with a photodiode. The inductive loop is arranged around at least part of the photodiode cathode pad, and configured to receive inductive loop inducing signaling, and provide inductive loop signaling around the at least part of the photodiode cathode pad to provide inductive on the PCB to reduce or substantially eliminate unwanted electrical interference in electrical photodiode signaling provided from the photodiode. The inductive loop includes a trace and at least one via. The trace has a route along a signal path from a transistor collector pin around an LED anode pad. The at least one via is placed between LED anode pads to route the trace on a top side of the PCB, and the trace is routed alongside, near and around the photodiode cathode pad back to the LED anode of the LED anode pad. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP4275231A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP4275231A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP4275231A13</originalsourceid><addsrcrecordid>eNrjZDD39HMJdXZ1UXAO8g8ODnH08VZw9gxyDvUMUXDzD1Lw9A0I8g8DSge7-gUD-T6efq6OQZ4hkTwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrW4IDE5NS-1JN41wMTI3NTI2NDR0JgIJQANHCgT</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>INDUCED CROSSTALK CIRCUIT FOR IMPROVED SENSOR LINEARITY</title><source>esp@cenet</source><creator>PARMLEY, Steven M ; LEISS, Michael ; POSEY, Douglas J ; FLANAGAN, Kevin R</creator><creatorcontrib>PARMLEY, Steven M ; LEISS, Michael ; POSEY, Douglas J ; FLANAGAN, Kevin R</creatorcontrib><description>An optical sensor includes a detector having a printed circuit board (PCB) and an inductive loop. The printed circuit board (PCB) has a photodiode cathode pad with a photodiode. The inductive loop is arranged around at least part of the photodiode cathode pad, and configured to receive inductive loop inducing signaling, and provide inductive loop signaling around the at least part of the photodiode cathode pad to provide inductive on the PCB to reduce or substantially eliminate unwanted electrical interference in electrical photodiode signaling provided from the photodiode. The inductive loop includes a trace and at least one via. The trace has a route along a signal path from a transistor collector pin around an LED anode pad. The at least one via is placed between LED anode pads to route the trace on a top side of the PCB, and the trace is routed alongside, near and around the photodiode cathode pad back to the LED anode of the LED anode pad.</description><language>eng ; fre ; ger</language><subject>BASIC ELECTRIC ELEMENTS ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; SEMICONDUCTOR DEVICES ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231115&DB=EPODOC&CC=EP&NR=4275231A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76289</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231115&DB=EPODOC&CC=EP&NR=4275231A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>PARMLEY, Steven M</creatorcontrib><creatorcontrib>LEISS, Michael</creatorcontrib><creatorcontrib>POSEY, Douglas J</creatorcontrib><creatorcontrib>FLANAGAN, Kevin R</creatorcontrib><title>INDUCED CROSSTALK CIRCUIT FOR IMPROVED SENSOR LINEARITY</title><description>An optical sensor includes a detector having a printed circuit board (PCB) and an inductive loop. The printed circuit board (PCB) has a photodiode cathode pad with a photodiode. The inductive loop is arranged around at least part of the photodiode cathode pad, and configured to receive inductive loop inducing signaling, and provide inductive loop signaling around the at least part of the photodiode cathode pad to provide inductive on the PCB to reduce or substantially eliminate unwanted electrical interference in electrical photodiode signaling provided from the photodiode. The inductive loop includes a trace and at least one via. The trace has a route along a signal path from a transistor collector pin around an LED anode pad. The at least one via is placed between LED anode pads to route the trace on a top side of the PCB, and the trace is routed alongside, near and around the photodiode cathode pad back to the LED anode of the LED anode pad.</description><subject>BASIC ELECTRIC ELEMENTS</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZDD39HMJdXZ1UXAO8g8ODnH08VZw9gxyDvUMUXDzD1Lw9A0I8g8DSge7-gUD-T6efq6OQZ4hkTwMrGmJOcWpvFCam0HBzTXE2UM3tSA_PrW4IDE5NS-1JN41wMTI3NTI2NDR0JgIJQANHCgT</recordid><startdate>20231115</startdate><enddate>20231115</enddate><creator>PARMLEY, Steven M</creator><creator>LEISS, Michael</creator><creator>POSEY, Douglas J</creator><creator>FLANAGAN, Kevin R</creator><scope>EVB</scope></search><sort><creationdate>20231115</creationdate><title>INDUCED CROSSTALK CIRCUIT FOR IMPROVED SENSOR LINEARITY</title><author>PARMLEY, Steven M ; LEISS, Michael ; POSEY, Douglas J ; FLANAGAN, Kevin R</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4275231A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2023</creationdate><topic>BASIC ELECTRIC ELEMENTS</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>PARMLEY, Steven M</creatorcontrib><creatorcontrib>LEISS, Michael</creatorcontrib><creatorcontrib>POSEY, Douglas J</creatorcontrib><creatorcontrib>FLANAGAN, Kevin R</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>PARMLEY, Steven M</au><au>LEISS, Michael</au><au>POSEY, Douglas J</au><au>FLANAGAN, Kevin R</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>INDUCED CROSSTALK CIRCUIT FOR IMPROVED SENSOR LINEARITY</title><date>2023-11-15</date><risdate>2023</risdate><abstract>An optical sensor includes a detector having a printed circuit board (PCB) and an inductive loop. The printed circuit board (PCB) has a photodiode cathode pad with a photodiode. The inductive loop is arranged around at least part of the photodiode cathode pad, and configured to receive inductive loop inducing signaling, and provide inductive loop signaling around the at least part of the photodiode cathode pad to provide inductive on the PCB to reduce or substantially eliminate unwanted electrical interference in electrical photodiode signaling provided from the photodiode. The inductive loop includes a trace and at least one via. The trace has a route along a signal path from a transistor collector pin around an LED anode pad. The at least one via is placed between LED anode pads to route the trace on a top side of the PCB, and the trace is routed alongside, near and around the photodiode cathode pad back to the LED anode of the LED anode pad.</abstract><oa>free_for_read</oa></addata></record> |
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| subjects | BASIC ELECTRIC ELEMENTS ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS SEMICONDUCTOR DEVICES TESTING |
| title | INDUCED CROSSTALK CIRCUIT FOR IMPROVED SENSOR LINEARITY |
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