HIGH-DIMENSIONAL PARAMETER DETERMINATION BASED ON MR FINGERPRINTING MEASUREMENTS

HIGH-DIMENSIONAL PARAMETER DETERMINATION BASED ON MR FINGERPRINTING MEASUREMENTS

The present invention concerns a method for determining an estimated value for different parameters on the basis of one or more acquired signals obtained during a Magnetic Resonance Fingerprinting measurement. The method includes an iterative approach, where some parameters are treated as free param...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: Widmaier, Mark, Xin, Lijing, Lim, Songi
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator Widmaier, Mark
Xin, Lijing
Lim, Songi
description The present invention concerns a method for determining an estimated value for different parameters on the basis of one or more acquired signals obtained during a Magnetic Resonance Fingerprinting measurement. The method includes an iterative approach, where some parameters are treated as free parameters and the values of other parameters are provisionally set to an assumed value for creating a dictionary. In a subsequent iterative step, the values obtained by matching for previously free parameters are used to set these parameters, and previously set parameters are treated as free parameters. In some embodiments, the accuracy of the estimated is improved by a functional or correlational part, in which a correlation of parameters with a global parameter is used.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP4266075A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP4266075A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP4266075A13</originalsourceid><addsrcrecordid>eNrjZAjw8HT30HXx9HX1C_b093P0UQhwDHL0dQ1xDVJwAZG-nn6OIUAZBSfHYFcXBSDDN0jBzdPP3TUoIMjTLwTIUvB1dQwODXIFmhESzMPAmpaYU5zKC6W5GRTcXEOcPXRTC_LjU4sLEpNT81JL4l0DTIzMzAzMTR0NjYlQAgA-lC8J</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>HIGH-DIMENSIONAL PARAMETER DETERMINATION BASED ON MR FINGERPRINTING MEASUREMENTS</title><source>esp@cenet</source><creator>Widmaier, Mark ; Xin, Lijing ; Lim, Songi</creator><creatorcontrib>Widmaier, Mark ; Xin, Lijing ; Lim, Songi</creatorcontrib><description>The present invention concerns a method for determining an estimated value for different parameters on the basis of one or more acquired signals obtained during a Magnetic Resonance Fingerprinting measurement. The method includes an iterative approach, where some parameters are treated as free parameters and the values of other parameters are provisionally set to an assumed value for creating a dictionary. In a subsequent iterative step, the values obtained by matching for previously free parameters are used to set these parameters, and previously set parameters are treated as free parameters. In some embodiments, the accuracy of the estimated is improved by a functional or correlational part, in which a correlation of parameters with a global parameter is used.</description><language>eng ; fre ; ger</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20231025&amp;DB=EPODOC&amp;CC=EP&amp;NR=4266075A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20231025&amp;DB=EPODOC&amp;CC=EP&amp;NR=4266075A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>Widmaier, Mark</creatorcontrib><creatorcontrib>Xin, Lijing</creatorcontrib><creatorcontrib>Lim, Songi</creatorcontrib><title>HIGH-DIMENSIONAL PARAMETER DETERMINATION BASED ON MR FINGERPRINTING MEASUREMENTS</title><description>The present invention concerns a method for determining an estimated value for different parameters on the basis of one or more acquired signals obtained during a Magnetic Resonance Fingerprinting measurement. The method includes an iterative approach, where some parameters are treated as free parameters and the values of other parameters are provisionally set to an assumed value for creating a dictionary. In a subsequent iterative step, the values obtained by matching for previously free parameters are used to set these parameters, and previously set parameters are treated as free parameters. In some embodiments, the accuracy of the estimated is improved by a functional or correlational part, in which a correlation of parameters with a global parameter is used.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZAjw8HT30HXx9HX1C_b093P0UQhwDHL0dQ1xDVJwAZG-nn6OIUAZBSfHYFcXBSDDN0jBzdPP3TUoIMjTLwTIUvB1dQwODXIFmhESzMPAmpaYU5zKC6W5GRTcXEOcPXRTC_LjU4sLEpNT81JL4l0DTIzMzAzMTR0NjYlQAgA-lC8J</recordid><startdate>20231025</startdate><enddate>20231025</enddate><creator>Widmaier, Mark</creator><creator>Xin, Lijing</creator><creator>Lim, Songi</creator><scope>EVB</scope></search><sort><creationdate>20231025</creationdate><title>HIGH-DIMENSIONAL PARAMETER DETERMINATION BASED ON MR FINGERPRINTING MEASUREMENTS</title><author>Widmaier, Mark ; Xin, Lijing ; Lim, Songi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4266075A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>Widmaier, Mark</creatorcontrib><creatorcontrib>Xin, Lijing</creatorcontrib><creatorcontrib>Lim, Songi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>Widmaier, Mark</au><au>Xin, Lijing</au><au>Lim, Songi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>HIGH-DIMENSIONAL PARAMETER DETERMINATION BASED ON MR FINGERPRINTING MEASUREMENTS</title><date>2023-10-25</date><risdate>2023</risdate><abstract>The present invention concerns a method for determining an estimated value for different parameters on the basis of one or more acquired signals obtained during a Magnetic Resonance Fingerprinting measurement. The method includes an iterative approach, where some parameters are treated as free parameters and the values of other parameters are provisionally set to an assumed value for creating a dictionary. In a subsequent iterative step, the values obtained by matching for previously free parameters are used to set these parameters, and previously set parameters are treated as free parameters. In some embodiments, the accuracy of the estimated is improved by a functional or correlational part, in which a correlation of parameters with a global parameter is used.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP4266075A1
source esp@cenet
subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title HIGH-DIMENSIONAL PARAMETER DETERMINATION BASED ON MR FINGERPRINTING MEASUREMENTS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-23T19%3A32%3A25IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=Widmaier,%20Mark&rft.date=2023-10-25&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP4266075A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true