APPARATUS FOR POST EXPOSURE BAKE OF PHOTORESIST
A method and apparatus for applying an electric field and/or a magnetic field to a photoresist layer without air gap intervention during photolithography processes is provided herein. The method and apparatus include a chamber body, which is configured to be filled with a process fluid, and a substr...
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creator | DUKOVIC, John O LUBOMIRSKY, Dmitry NEMANI, Srinivas D BUCHBERGER, JR., Douglas A |
description | A method and apparatus for applying an electric field and/or a magnetic field to a photoresist layer without air gap intervention during photolithography processes is provided herein. The method and apparatus include a chamber body, which is configured to be filled with a process fluid, and a substrate carrier. The substrate carrier is disposed outside of the process volume while substrates are loaded onto the substrate carrier, but is rotated to a processing position either simultaneously or before entering the process fluid. The substrate carrier is rotated to a process position parallel to an electrode before an electric field is utilized to perform a post-exposure bake process on the substrate. |
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fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP4264663A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP4264663A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP4264663A13</originalsourceid><addsrcrecordid>eNrjZNB3DAhwDHIMCQ1WcPMPUgjwDw5RcI0AUqFBrgpOjt6uCv5uCgEe_iH-Qa7BnsEhPAysaYk5xam8UJqbQcHNNcTZQze1ID8-tbggMTk1L7Uk3jXAxMjMxMzM2NHQmAglANjbJeE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>APPARATUS FOR POST EXPOSURE BAKE OF PHOTORESIST</title><source>esp@cenet</source><creator>DUKOVIC, John O ; LUBOMIRSKY, Dmitry ; NEMANI, Srinivas D ; BUCHBERGER, JR., Douglas A</creator><creatorcontrib>DUKOVIC, John O ; LUBOMIRSKY, Dmitry ; NEMANI, Srinivas D ; BUCHBERGER, JR., Douglas A</creatorcontrib><description>A method and apparatus for applying an electric field and/or a magnetic field to a photoresist layer without air gap intervention during photolithography processes is provided herein. The method and apparatus include a chamber body, which is configured to be filled with a process fluid, and a substrate carrier. The substrate carrier is disposed outside of the process volume while substrates are loaded onto the substrate carrier, but is rotated to a processing position either simultaneously or before entering the process fluid. The substrate carrier is rotated to a process position parallel to an electrode before an electric field is utilized to perform a post-exposure bake process on the substrate.</description><language>eng ; fre ; ger</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; BASIC ELECTRIC ELEMENTS ; CINEMATOGRAPHY ; ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ; ELECTRICITY ; ELECTROGRAPHY ; HOLOGRAPHY ; MATERIALS THEREFOR ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; SEMICONDUCTOR DEVICES</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231025&DB=EPODOC&CC=EP&NR=4264663A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20231025&DB=EPODOC&CC=EP&NR=4264663A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>DUKOVIC, John O</creatorcontrib><creatorcontrib>LUBOMIRSKY, Dmitry</creatorcontrib><creatorcontrib>NEMANI, Srinivas D</creatorcontrib><creatorcontrib>BUCHBERGER, JR., Douglas A</creatorcontrib><title>APPARATUS FOR POST EXPOSURE BAKE OF PHOTORESIST</title><description>A method and apparatus for applying an electric field and/or a magnetic field to a photoresist layer without air gap intervention during photolithography processes is provided herein. The method and apparatus include a chamber body, which is configured to be filled with a process fluid, and a substrate carrier. The substrate carrier is disposed outside of the process volume while substrates are loaded onto the substrate carrier, but is rotated to a processing position either simultaneously or before entering the process fluid. The substrate carrier is rotated to a process position parallel to an electrode before an electric field is utilized to perform a post-exposure bake process on the substrate.</description><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>BASIC ELECTRIC ELEMENTS</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</subject><subject>ELECTRICITY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>MATERIALS THEREFOR</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>SEMICONDUCTOR DEVICES</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZNB3DAhwDHIMCQ1WcPMPUgjwDw5RcI0AUqFBrgpOjt6uCv5uCgEe_iH-Qa7BnsEhPAysaYk5xam8UJqbQcHNNcTZQze1ID8-tbggMTk1L7Uk3jXAxMjMxMzM2NHQmAglANjbJeE</recordid><startdate>20231025</startdate><enddate>20231025</enddate><creator>DUKOVIC, John O</creator><creator>LUBOMIRSKY, Dmitry</creator><creator>NEMANI, Srinivas D</creator><creator>BUCHBERGER, JR., Douglas A</creator><scope>EVB</scope></search><sort><creationdate>20231025</creationdate><title>APPARATUS FOR POST EXPOSURE BAKE OF PHOTORESIST</title><author>DUKOVIC, John O ; LUBOMIRSKY, Dmitry ; NEMANI, Srinivas D ; BUCHBERGER, JR., Douglas A</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4264663A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2023</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>BASIC ELECTRIC ELEMENTS</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR</topic><topic>ELECTRICITY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>MATERIALS THEREFOR</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>SEMICONDUCTOR DEVICES</topic><toplevel>online_resources</toplevel><creatorcontrib>DUKOVIC, John O</creatorcontrib><creatorcontrib>LUBOMIRSKY, Dmitry</creatorcontrib><creatorcontrib>NEMANI, Srinivas D</creatorcontrib><creatorcontrib>BUCHBERGER, JR., Douglas A</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>DUKOVIC, John O</au><au>LUBOMIRSKY, Dmitry</au><au>NEMANI, Srinivas D</au><au>BUCHBERGER, JR., Douglas A</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>APPARATUS FOR POST EXPOSURE BAKE OF PHOTORESIST</title><date>2023-10-25</date><risdate>2023</risdate><abstract>A method and apparatus for applying an electric field and/or a magnetic field to a photoresist layer without air gap intervention during photolithography processes is provided herein. The method and apparatus include a chamber body, which is configured to be filled with a process fluid, and a substrate carrier. The substrate carrier is disposed outside of the process volume while substrates are loaded onto the substrate carrier, but is rotated to a processing position either simultaneously or before entering the process fluid. The substrate carrier is rotated to a process position parallel to an electrode before an electric field is utilized to perform a post-exposure bake process on the substrate.</abstract><oa>free_for_read</oa></addata></record> |
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subjects | APPARATUS SPECIALLY ADAPTED THEREFOR BASIC ELECTRIC ELEMENTS CINEMATOGRAPHY ELECTRIC SOLID STATE DEVICES NOT OTHERWISE PROVIDED FOR ELECTRICITY ELECTROGRAPHY HOLOGRAPHY MATERIALS THEREFOR ORIGINALS THEREFOR PHOTOGRAPHY PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES PHYSICS SEMICONDUCTOR DEVICES |
title | APPARATUS FOR POST EXPOSURE BAKE OF PHOTORESIST |
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