ANOMALY DETERMINATION DEVICE, METHOD FOR GENERATING ANOMALY DETERMINATION MODEL, AND ANOMALY DETERMINATION METHOD
An abnormality determination apparatus includes a time-series signal clipping unit, a normal vector registration unit, an abnormality determination model registration unit, and an abnormality determination unit. In a case where an abnormality determination flag is of a first type, the abnormality de...
Gespeichert in:
| Hauptverfasser: | , |
|---|---|
| Format: | Patent |
| Sprache: | eng ; fre ; ger |
| Schlagworte: | |
| Online-Zugang: | Volltext bestellen |
| Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
| container_end_page | |
|---|---|
| container_issue | |
| container_start_page | |
| container_title | |
| container_volume | |
| creator | HIRATA, Takehide SHOMURA, Kei |
| description | An abnormality determination apparatus includes a time-series signal clipping unit, a normal vector registration unit, an abnormality determination model registration unit, and an abnormality determination unit. In a case where an abnormality determination flag is of a first type, the abnormality determination unit calculates a distance from a registered normal vector, extracts a predetermined number of normal vectors as neighboring data in ascending order of the distance, calculates a distance between a centroid vector of the neighboring data and an M-dimensional vector to be a target of abnormality determination, and performs abnormality determination of a facility based on the distance. In a case where the abnormality determination flag is of a second type, the abnormality determination unit calculates a deviation from a principal component based on a transform coefficient of a principal component, which has been calculated in advance, and performs abnormality determination of the facility based on the deviation. |
| format | Patent |
| fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP4261641A4</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP4261641A4</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP4261641A43</originalsourceid><addsrcrecordid>eNrjZCh09PP3dfSJVHBxDXEN8vX0cwzx9PcD8sI8nV11FHxdQzz8XRTc_IMU3F39XIOAsn7uCtj1-Pq7uProACVdcCkAG8bDwJqWmFOcyguluRkU3FxDnD10Uwvy41OLCxKTU_NSS-JdA0yMzAzNTAwdTYyJUAIApW43uw</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ANOMALY DETERMINATION DEVICE, METHOD FOR GENERATING ANOMALY DETERMINATION MODEL, AND ANOMALY DETERMINATION METHOD</title><source>esp@cenet</source><creator>HIRATA, Takehide ; SHOMURA, Kei</creator><creatorcontrib>HIRATA, Takehide ; SHOMURA, Kei</creatorcontrib><description>An abnormality determination apparatus includes a time-series signal clipping unit, a normal vector registration unit, an abnormality determination model registration unit, and an abnormality determination unit. In a case where an abnormality determination flag is of a first type, the abnormality determination unit calculates a distance from a registered normal vector, extracts a predetermined number of normal vectors as neighboring data in ascending order of the distance, calculates a distance between a centroid vector of the neighboring data and an M-dimensional vector to be a target of abnormality determination, and performs abnormality determination of a facility based on the distance. In a case where the abnormality determination flag is of a second type, the abnormality determination unit calculates a deviation from a principal component based on a transform coefficient of a principal component, which has been calculated in advance, and performs abnormality determination of the facility based on the deviation.</description><language>eng ; fre ; ger</language><subject>CALCULATING ; COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS ; COMPUTING ; CONTROL OR REGULATING SYSTEMS IN GENERAL ; CONTROLLING ; COUNTING ; FUNCTIONAL ELEMENTS OF SUCH SYSTEMS ; MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS ; PHYSICS ; REGULATING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240605&DB=EPODOC&CC=EP&NR=4261641A4$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25563,76318</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240605&DB=EPODOC&CC=EP&NR=4261641A4$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>HIRATA, Takehide</creatorcontrib><creatorcontrib>SHOMURA, Kei</creatorcontrib><title>ANOMALY DETERMINATION DEVICE, METHOD FOR GENERATING ANOMALY DETERMINATION MODEL, AND ANOMALY DETERMINATION METHOD</title><description>An abnormality determination apparatus includes a time-series signal clipping unit, a normal vector registration unit, an abnormality determination model registration unit, and an abnormality determination unit. In a case where an abnormality determination flag is of a first type, the abnormality determination unit calculates a distance from a registered normal vector, extracts a predetermined number of normal vectors as neighboring data in ascending order of the distance, calculates a distance between a centroid vector of the neighboring data and an M-dimensional vector to be a target of abnormality determination, and performs abnormality determination of a facility based on the distance. In a case where the abnormality determination flag is of a second type, the abnormality determination unit calculates a deviation from a principal component based on a transform coefficient of a principal component, which has been calculated in advance, and performs abnormality determination of the facility based on the deviation.</description><subject>CALCULATING</subject><subject>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</subject><subject>COMPUTING</subject><subject>CONTROL OR REGULATING SYSTEMS IN GENERAL</subject><subject>CONTROLLING</subject><subject>COUNTING</subject><subject>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</subject><subject>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</subject><subject>PHYSICS</subject><subject>REGULATING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZCh09PP3dfSJVHBxDXEN8vX0cwzx9PcD8sI8nV11FHxdQzz8XRTc_IMU3F39XIOAsn7uCtj1-Pq7uProACVdcCkAG8bDwJqWmFOcyguluRkU3FxDnD10Uwvy41OLCxKTU_NSS-JdA0yMzAzNTAwdTYyJUAIApW43uw</recordid><startdate>20240605</startdate><enddate>20240605</enddate><creator>HIRATA, Takehide</creator><creator>SHOMURA, Kei</creator><scope>EVB</scope></search><sort><creationdate>20240605</creationdate><title>ANOMALY DETERMINATION DEVICE, METHOD FOR GENERATING ANOMALY DETERMINATION MODEL, AND ANOMALY DETERMINATION METHOD</title><author>HIRATA, Takehide ; SHOMURA, Kei</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4261641A43</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2024</creationdate><topic>CALCULATING</topic><topic>COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS</topic><topic>COMPUTING</topic><topic>CONTROL OR REGULATING SYSTEMS IN GENERAL</topic><topic>CONTROLLING</topic><topic>COUNTING</topic><topic>FUNCTIONAL ELEMENTS OF SUCH SYSTEMS</topic><topic>MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS</topic><topic>PHYSICS</topic><topic>REGULATING</topic><toplevel>online_resources</toplevel><creatorcontrib>HIRATA, Takehide</creatorcontrib><creatorcontrib>SHOMURA, Kei</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>HIRATA, Takehide</au><au>SHOMURA, Kei</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ANOMALY DETERMINATION DEVICE, METHOD FOR GENERATING ANOMALY DETERMINATION MODEL, AND ANOMALY DETERMINATION METHOD</title><date>2024-06-05</date><risdate>2024</risdate><abstract>An abnormality determination apparatus includes a time-series signal clipping unit, a normal vector registration unit, an abnormality determination model registration unit, and an abnormality determination unit. In a case where an abnormality determination flag is of a first type, the abnormality determination unit calculates a distance from a registered normal vector, extracts a predetermined number of normal vectors as neighboring data in ascending order of the distance, calculates a distance between a centroid vector of the neighboring data and an M-dimensional vector to be a target of abnormality determination, and performs abnormality determination of a facility based on the distance. In a case where the abnormality determination flag is of a second type, the abnormality determination unit calculates a deviation from a principal component based on a transform coefficient of a principal component, which has been calculated in advance, and performs abnormality determination of the facility based on the deviation.</abstract><oa>free_for_read</oa></addata></record> |
| fulltext | fulltext_linktorsrc |
| identifier | |
| ispartof | |
| issn | |
| language | eng ; fre ; ger |
| recordid | cdi_epo_espacenet_EP4261641A4 |
| source | esp@cenet |
| subjects | CALCULATING COMPUTER SYSTEMS BASED ON SPECIFIC COMPUTATIONAL MODELS COMPUTING CONTROL OR REGULATING SYSTEMS IN GENERAL CONTROLLING COUNTING FUNCTIONAL ELEMENTS OF SUCH SYSTEMS MONITORING OR TESTING ARRANGEMENTS FOR SUCH SYSTEMS ORELEMENTS PHYSICS REGULATING |
| title | ANOMALY DETERMINATION DEVICE, METHOD FOR GENERATING ANOMALY DETERMINATION MODEL, AND ANOMALY DETERMINATION METHOD |
| url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T13%3A21%3A22IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=HIRATA,%20Takehide&rft.date=2024-06-05&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP4261641A4%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |