ANOMALY DETERMINATION MODEL GENERATION DEVICE, ANOMALY DETERMINATION DEVICE, ANOMALY DETERMINATION MODEL GENERATION METHOD, AND ANOMALY DETERMINATION METHOD

An abnormality determination model generating device generates a first abnormality determination model by calculating an average and a variance of each of variables in a case where a maximum value of a correlation between the variables is less than a predetermined value for K L-dimensional vectors i...

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Hauptverfasser: HIRATA, Takehide, SHOMURA, Kei
Format: Patent
Sprache:eng ; fre ; ger
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Zusammenfassung:An abnormality determination model generating device generates a first abnormality determination model by calculating an average and a variance of each of variables in a case where a maximum value of a correlation between the variables is less than a predetermined value for K L-dimensional vectors in an L-dimensional variable space, generates a second abnormality determination model by performing principal component analysis and calculating a transformation coefficient of a principal component in a case where the maximum value of the correlation between the variables is greater than or equal to a predetermined value, and configures an M-dimensional vector including M types of variables at the same time and generates a third abnormality determination model by performing principal component analysis on a plurality of M-dimensional vectors and calculating a transformation coefficient of a principal component in a case where time-series signals during normal operation have M types (M ≥ 2).