X-RAY FLUORESCENCE SPECTROMETER

By regarding total precision of an X-ray intensity as counting precision due to statistical fluctuation and counting loss and by regarding the counting precision as a product of precision of an uncorrected intensity, which is an intensity before counting loss correction is performed, and a gradient...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	NAGOSHI, Yasuhiko, KATAOKA, Yoshiyuki, FURUSAWA, Eiichi
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASUREMENT OF NUCLEAR OR X-RADIATION MEASURING PHYSICS TESTING
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