IMPROVED METHOD FOR MEASURING A MISALIGNMENT USING SMALL ANGLE SCATTERING BY TRANSMISSION - T-SAXS; ASSOCIATED INSTRUMENTAL SYSTEM AND COMPUTER PROGRAM PRODUCT

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Hauptverfasser: RECHE, Jérôme, GERGAUD, Patrice, ALRIFAI, Liliane, BLANCQUAERT, Yoann
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GERGAUD, Patrice
ALRIFAI, Liliane
BLANCQUAERT, Yoann
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP4246135B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP4246135B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP4246135B13</originalsourceid><addsrcrecordid>eNqNjjsOwjAQRNNQIOAOe4EUkEBDtXGcYMmfyLtGpIoQMhWCSHAfroqDOADVjFYzb2eevZXpvDvKGozkg6uhcT5ZpOCVbQHBKEKtWmukZQg0Hcmg1oC21RJIILP8Zqse2KOl1CDlLOTAOeGJ9oBETijk9EVZYh8mGGqgnliaRKpBONOFBIK0pvVoJq2D4GU2u55vz7j66SKDRrI45HF8DPE5ni_xHl-D7MpNuVsX22pd_BH5APkjRNE</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>IMPROVED METHOD FOR MEASURING A MISALIGNMENT USING SMALL ANGLE SCATTERING BY TRANSMISSION - T-SAXS; ASSOCIATED INSTRUMENTAL SYSTEM AND COMPUTER PROGRAM PRODUCT</title><source>esp@cenet</source><creator>RECHE, Jérôme ; GERGAUD, Patrice ; ALRIFAI, Liliane ; BLANCQUAERT, Yoann</creator><creatorcontrib>RECHE, Jérôme ; GERGAUD, Patrice ; ALRIFAI, Liliane ; BLANCQUAERT, Yoann</creatorcontrib><language>eng ; fre ; ger</language><subject>APPARATUS SPECIALLY ADAPTED THEREFOR ; CINEMATOGRAPHY ; ELECTROGRAPHY ; HOLOGRAPHY ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MATERIALS THEREFOR ; MEASURING ; ORIGINALS THEREFOR ; PHOTOGRAPHY ; PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20241211&amp;DB=EPODOC&amp;CC=EP&amp;NR=4246135B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76294</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20241211&amp;DB=EPODOC&amp;CC=EP&amp;NR=4246135B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>RECHE, Jérôme</creatorcontrib><creatorcontrib>GERGAUD, Patrice</creatorcontrib><creatorcontrib>ALRIFAI, Liliane</creatorcontrib><creatorcontrib>BLANCQUAERT, Yoann</creatorcontrib><title>IMPROVED METHOD FOR MEASURING A MISALIGNMENT USING SMALL ANGLE SCATTERING BY TRANSMISSION - T-SAXS; ASSOCIATED INSTRUMENTAL SYSTEM AND COMPUTER PROGRAM PRODUCT</title><subject>APPARATUS SPECIALLY ADAPTED THEREFOR</subject><subject>CINEMATOGRAPHY</subject><subject>ELECTROGRAPHY</subject><subject>HOLOGRAPHY</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MATERIALS THEREFOR</subject><subject>MEASURING</subject><subject>ORIGINALS THEREFOR</subject><subject>PHOTOGRAPHY</subject><subject>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjjsOwjAQRNNQIOAOe4EUkEBDtXGcYMmfyLtGpIoQMhWCSHAfroqDOADVjFYzb2eevZXpvDvKGozkg6uhcT5ZpOCVbQHBKEKtWmukZQg0Hcmg1oC21RJIILP8Zqse2KOl1CDlLOTAOeGJ9oBETijk9EVZYh8mGGqgnliaRKpBONOFBIK0pvVoJq2D4GU2u55vz7j66SKDRrI45HF8DPE5ni_xHl-D7MpNuVsX22pd_BH5APkjRNE</recordid><startdate>20241211</startdate><enddate>20241211</enddate><creator>RECHE, Jérôme</creator><creator>GERGAUD, Patrice</creator><creator>ALRIFAI, Liliane</creator><creator>BLANCQUAERT, Yoann</creator><scope>EVB</scope></search><sort><creationdate>20241211</creationdate><title>IMPROVED METHOD FOR MEASURING A MISALIGNMENT USING SMALL ANGLE SCATTERING BY TRANSMISSION - T-SAXS; ASSOCIATED INSTRUMENTAL SYSTEM AND COMPUTER PROGRAM PRODUCT</title><author>RECHE, Jérôme ; GERGAUD, Patrice ; ALRIFAI, Liliane ; BLANCQUAERT, Yoann</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4246135B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2024</creationdate><topic>APPARATUS SPECIALLY ADAPTED THEREFOR</topic><topic>CINEMATOGRAPHY</topic><topic>ELECTROGRAPHY</topic><topic>HOLOGRAPHY</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MATERIALS THEREFOR</topic><topic>MEASURING</topic><topic>ORIGINALS THEREFOR</topic><topic>PHOTOGRAPHY</topic><topic>PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>RECHE, Jérôme</creatorcontrib><creatorcontrib>GERGAUD, Patrice</creatorcontrib><creatorcontrib>ALRIFAI, Liliane</creatorcontrib><creatorcontrib>BLANCQUAERT, Yoann</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>RECHE, Jérôme</au><au>GERGAUD, Patrice</au><au>ALRIFAI, Liliane</au><au>BLANCQUAERT, Yoann</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>IMPROVED METHOD FOR MEASURING A MISALIGNMENT USING SMALL ANGLE SCATTERING BY TRANSMISSION - T-SAXS; ASSOCIATED INSTRUMENTAL SYSTEM AND COMPUTER PROGRAM PRODUCT</title><date>2024-12-11</date><risdate>2024</risdate><oa>free_for_read</oa></addata></record>
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language eng ; fre ; ger
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subjects APPARATUS SPECIALLY ADAPTED THEREFOR
CINEMATOGRAPHY
ELECTROGRAPHY
HOLOGRAPHY
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MATERIALS THEREFOR
MEASURING
ORIGINALS THEREFOR
PHOTOGRAPHY
PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES,e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTORDEVICES
PHYSICS
TESTING
title IMPROVED METHOD FOR MEASURING A MISALIGNMENT USING SMALL ANGLE SCATTERING BY TRANSMISSION - T-SAXS; ASSOCIATED INSTRUMENTAL SYSTEM AND COMPUTER PROGRAM PRODUCT
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