INTEGRATED CIRCUIT HAVING AN IN-SITU CIRCUIT FOR DETECTING AN IMPENDING CIRCUIT FAILURE

Method and integrated circuit for indicating a failure of a critical path. The integrated circuit comprising: 1) a critical data path including a flip flop configured to receive a data input and provide a latched data output; and 2) a monitoring circuit including a delay generator configured to rece...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	Tipple, David Russell, Onyema, Emmanuel Chukwuma, Jarrar, Anis Mahmoud
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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