SYSTEMS AND METHODS FOR AUTOMATIC VISUAL INSPECTION OF DEFECTS IN OPHTHALMIC LENSES
Automatic visual inspection (AVI) systems and methods are disclosed for inspecting transmissive lenses using a plurality of camera poses to provide deflectometric measurements using fringe patterns from at least two points of view. Phase and/or modulation visibility values of the deflectometric meas...
Gespeichert in:
Hauptverfasser: | , , , , |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | CRESPO VÁZQUEZ, Daniel MELLADO, Juan Antonio Quiroga FERNÁNDEZ, José Alonso SAMPEDRO, Sergio PASCUAL, Eduardo |
description | Automatic visual inspection (AVI) systems and methods are disclosed for inspecting transmissive lenses using a plurality of camera poses to provide deflectometric measurements using fringe patterns from at least two points of view. Phase and/or modulation visibility values of the deflectometric measurements are measured for two sensitivities of the patterns taken through an inspection area of the lens from the points of view. Defects are detected based on the phase and/or modulation visibility values at a defect location as compared to at the local area. A defect type is classified to be prismatic, transmissive, lenslet or cosmetic based on the phase and/or modulation visibility values. The defect is localized on the front or back surface of the lens based on the phase and modulation visibility values, and a geometry of the lens orientation. The lens can be invalidated based on defect types, numbers, relative positions and locations. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP4217704A4</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP4217704A4</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP4217704A43</originalsourceid><addsrcrecordid>eNqNijsKAjEQQNNYiHqHuYDgJ7B12ExIIMkEZ1awWhaJlejCen9M4QGsHu_x1or5xoKJwWQLCcWTZXB0ATMIJSOhh2vgwUQImQv2EigDObDomnCrQMWLNzG1NWJm5K1aPabnUnc_bhQ4lN7v6_we6zJP9_qqnxGLPh277qCNPv-xfAG2Ci-U</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEMS AND METHODS FOR AUTOMATIC VISUAL INSPECTION OF DEFECTS IN OPHTHALMIC LENSES</title><source>esp@cenet</source><creator>CRESPO VÁZQUEZ, Daniel ; MELLADO, Juan Antonio Quiroga ; FERNÁNDEZ, José Alonso ; SAMPEDRO, Sergio ; PASCUAL, Eduardo</creator><creatorcontrib>CRESPO VÁZQUEZ, Daniel ; MELLADO, Juan Antonio Quiroga ; FERNÁNDEZ, José Alonso ; SAMPEDRO, Sergio ; PASCUAL, Eduardo</creatorcontrib><description>Automatic visual inspection (AVI) systems and methods are disclosed for inspecting transmissive lenses using a plurality of camera poses to provide deflectometric measurements using fringe patterns from at least two points of view. Phase and/or modulation visibility values of the deflectometric measurements are measured for two sensitivities of the patterns taken through an inspection area of the lens from the points of view. Defects are detected based on the phase and/or modulation visibility values at a defect location as compared to at the local area. A defect type is classified to be prismatic, transmissive, lenslet or cosmetic based on the phase and/or modulation visibility values. The defect is localized on the front or back surface of the lens based on the phase and modulation visibility values, and a geometry of the lens orientation. The lens can be invalidated based on defect types, numbers, relative positions and locations.</description><language>eng ; fre ; ger</language><subject>CONTACT LENSES ; DRESSING OR CONDITIONING OF ABRADING SURFACES ; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS ; GRINDING ; INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING ; MEASURING ; OPTICS ; PERFORMING OPERATIONS ; PHYSICS ; POLISHING ; SPECTACLES ; SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURESAS SPECTACLES ; TESTING ; TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES ; TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR ; TRANSPORTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241106&DB=EPODOC&CC=EP&NR=4217704A4$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25562,76317</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241106&DB=EPODOC&CC=EP&NR=4217704A4$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>CRESPO VÁZQUEZ, Daniel</creatorcontrib><creatorcontrib>MELLADO, Juan Antonio Quiroga</creatorcontrib><creatorcontrib>FERNÁNDEZ, José Alonso</creatorcontrib><creatorcontrib>SAMPEDRO, Sergio</creatorcontrib><creatorcontrib>PASCUAL, Eduardo</creatorcontrib><title>SYSTEMS AND METHODS FOR AUTOMATIC VISUAL INSPECTION OF DEFECTS IN OPHTHALMIC LENSES</title><description>Automatic visual inspection (AVI) systems and methods are disclosed for inspecting transmissive lenses using a plurality of camera poses to provide deflectometric measurements using fringe patterns from at least two points of view. Phase and/or modulation visibility values of the deflectometric measurements are measured for two sensitivities of the patterns taken through an inspection area of the lens from the points of view. Defects are detected based on the phase and/or modulation visibility values at a defect location as compared to at the local area. A defect type is classified to be prismatic, transmissive, lenslet or cosmetic based on the phase and/or modulation visibility values. The defect is localized on the front or back surface of the lens based on the phase and modulation visibility values, and a geometry of the lens orientation. The lens can be invalidated based on defect types, numbers, relative positions and locations.</description><subject>CONTACT LENSES</subject><subject>DRESSING OR CONDITIONING OF ABRADING SURFACES</subject><subject>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</subject><subject>GRINDING</subject><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</subject><subject>MEASURING</subject><subject>OPTICS</subject><subject>PERFORMING OPERATIONS</subject><subject>PHYSICS</subject><subject>POLISHING</subject><subject>SPECTACLES</subject><subject>SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURESAS SPECTACLES</subject><subject>TESTING</subject><subject>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</subject><subject>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</subject><subject>TRANSPORTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNijsKAjEQQNNYiHqHuYDgJ7B12ExIIMkEZ1awWhaJlejCen9M4QGsHu_x1or5xoKJwWQLCcWTZXB0ATMIJSOhh2vgwUQImQv2EigDObDomnCrQMWLNzG1NWJm5K1aPabnUnc_bhQ4lN7v6_we6zJP9_qqnxGLPh277qCNPv-xfAG2Ci-U</recordid><startdate>20241106</startdate><enddate>20241106</enddate><creator>CRESPO VÁZQUEZ, Daniel</creator><creator>MELLADO, Juan Antonio Quiroga</creator><creator>FERNÁNDEZ, José Alonso</creator><creator>SAMPEDRO, Sergio</creator><creator>PASCUAL, Eduardo</creator><scope>EVB</scope></search><sort><creationdate>20241106</creationdate><title>SYSTEMS AND METHODS FOR AUTOMATIC VISUAL INSPECTION OF DEFECTS IN OPHTHALMIC LENSES</title><author>CRESPO VÁZQUEZ, Daniel ; MELLADO, Juan Antonio Quiroga ; FERNÁNDEZ, José Alonso ; SAMPEDRO, Sergio ; PASCUAL, Eduardo</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4217704A43</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2024</creationdate><topic>CONTACT LENSES</topic><topic>DRESSING OR CONDITIONING OF ABRADING SURFACES</topic><topic>FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS</topic><topic>GRINDING</topic><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING</topic><topic>MEASURING</topic><topic>OPTICS</topic><topic>PERFORMING OPERATIONS</topic><topic>PHYSICS</topic><topic>POLISHING</topic><topic>SPECTACLES</topic><topic>SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURESAS SPECTACLES</topic><topic>TESTING</topic><topic>TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES</topic><topic>TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR</topic><topic>TRANSPORTING</topic><toplevel>online_resources</toplevel><creatorcontrib>CRESPO VÁZQUEZ, Daniel</creatorcontrib><creatorcontrib>MELLADO, Juan Antonio Quiroga</creatorcontrib><creatorcontrib>FERNÁNDEZ, José Alonso</creatorcontrib><creatorcontrib>SAMPEDRO, Sergio</creatorcontrib><creatorcontrib>PASCUAL, Eduardo</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>CRESPO VÁZQUEZ, Daniel</au><au>MELLADO, Juan Antonio Quiroga</au><au>FERNÁNDEZ, José Alonso</au><au>SAMPEDRO, Sergio</au><au>PASCUAL, Eduardo</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEMS AND METHODS FOR AUTOMATIC VISUAL INSPECTION OF DEFECTS IN OPHTHALMIC LENSES</title><date>2024-11-06</date><risdate>2024</risdate><abstract>Automatic visual inspection (AVI) systems and methods are disclosed for inspecting transmissive lenses using a plurality of camera poses to provide deflectometric measurements using fringe patterns from at least two points of view. Phase and/or modulation visibility values of the deflectometric measurements are measured for two sensitivities of the patterns taken through an inspection area of the lens from the points of view. Defects are detected based on the phase and/or modulation visibility values at a defect location as compared to at the local area. A defect type is classified to be prismatic, transmissive, lenslet or cosmetic based on the phase and/or modulation visibility values. The defect is localized on the front or back surface of the lens based on the phase and modulation visibility values, and a geometry of the lens orientation. The lens can be invalidated based on defect types, numbers, relative positions and locations.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng ; fre ; ger |
recordid | cdi_epo_espacenet_EP4217704A4 |
source | esp@cenet |
subjects | CONTACT LENSES DRESSING OR CONDITIONING OF ABRADING SURFACES FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS GRINDING INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING MEASURING OPTICS PERFORMING OPERATIONS PHYSICS POLISHING SPECTACLES SUNGLASSES OR GOGGLES INSOFAR AS THEY HAVE THE SAME FEATURESAS SPECTACLES TESTING TESTING STATIC OR DYNAMIC BALANCE OF MACHINES ORSTRUCTURES TESTING STRUCTURES OR APPARATUS NOT OTHERWISE PROVIDED FOR TRANSPORTING |
title | SYSTEMS AND METHODS FOR AUTOMATIC VISUAL INSPECTION OF DEFECTS IN OPHTHALMIC LENSES |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-10T05%3A21%3A27IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=CRESPO%20V%C3%81ZQUEZ,%20Daniel&rft.date=2024-11-06&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP4217704A4%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |