DYNAMIC FOCUS SYSTEM AND METHODS
The present invention relates to a method of analysing a particle within an image, the method comprising: (a) determining a border of the particle, the border being a ring generated by border pixels: (b) determining a plurality of bins inward and/or outward from the border; and (c) calculating an av...
Gespeichert in:
Hauptverfasser: | , , , |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | WANDERS, Bart J LU, Jiuliu QIAN, Bian RILEY, John |
description | The present invention relates to a method of analysing a particle within an image, the method comprising: (a) determining a border of the particle, the border being a ring generated by border pixels: (b) determining a plurality of bins inward and/or outward from the border; and (c) calculating an average V value for each bin by identifying a V value for each pixel within the respective bin and calculating the average. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP4209777B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP4209777B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP4209777B13</originalsourceid><addsrcrecordid>eNrjZFBwifRz9PV0VnDzdw4NVgiODA5x9VVw9HNR8HUN8fB3CeZhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGuASZGBpbm5uZOhsZEKAEAssMhig</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>DYNAMIC FOCUS SYSTEM AND METHODS</title><source>esp@cenet</source><creator>WANDERS, Bart J ; LU, Jiuliu ; QIAN, Bian ; RILEY, John</creator><creatorcontrib>WANDERS, Bart J ; LU, Jiuliu ; QIAN, Bian ; RILEY, John</creatorcontrib><description>The present invention relates to a method of analysing a particle within an image, the method comprising: (a) determining a border of the particle, the border being a ring generated by border pixels: (b) determining a plurality of bins inward and/or outward from the border; and (c) calculating an average V value for each bin by identifying a V value for each pixel within the respective bin and calculating the average.</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS ; OPTICS ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240918&DB=EPODOC&CC=EP&NR=4209777B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20240918&DB=EPODOC&CC=EP&NR=4209777B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>WANDERS, Bart J</creatorcontrib><creatorcontrib>LU, Jiuliu</creatorcontrib><creatorcontrib>QIAN, Bian</creatorcontrib><creatorcontrib>RILEY, John</creatorcontrib><title>DYNAMIC FOCUS SYSTEM AND METHODS</title><description>The present invention relates to a method of analysing a particle within an image, the method comprising: (a) determining a border of the particle, the border being a ring generated by border pixels: (b) determining a plurality of bins inward and/or outward from the border; and (c) calculating an average V value for each bin by identifying a V value for each pixel within the respective bin and calculating the average.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</subject><subject>OPTICS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFBwifRz9PV0VnDzdw4NVgiODA5x9VVw9HNR8HUN8fB3CeZhYE1LzClO5YXS3AwKbq4hzh66qQX58anFBYnJqXmpJfGuASZGBpbm5uZOhsZEKAEAssMhig</recordid><startdate>20240918</startdate><enddate>20240918</enddate><creator>WANDERS, Bart J</creator><creator>LU, Jiuliu</creator><creator>QIAN, Bian</creator><creator>RILEY, John</creator><scope>EVB</scope></search><sort><creationdate>20240918</creationdate><title>DYNAMIC FOCUS SYSTEM AND METHODS</title><author>WANDERS, Bart J ; LU, Jiuliu ; QIAN, Bian ; RILEY, John</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4209777B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS</topic><topic>OPTICS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>WANDERS, Bart J</creatorcontrib><creatorcontrib>LU, Jiuliu</creatorcontrib><creatorcontrib>QIAN, Bian</creatorcontrib><creatorcontrib>RILEY, John</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>WANDERS, Bart J</au><au>LU, Jiuliu</au><au>QIAN, Bian</au><au>RILEY, John</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>DYNAMIC FOCUS SYSTEM AND METHODS</title><date>2024-09-18</date><risdate>2024</risdate><abstract>The present invention relates to a method of analysing a particle within an image, the method comprising: (a) determining a border of the particle, the border being a ring generated by border pixels: (b) determining a plurality of bins inward and/or outward from the border; and (c) calculating an average V value for each bin by identifying a V value for each pixel within the respective bin and calculating the average.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng ; fre ; ger |
recordid | cdi_epo_espacenet_EP4209777B1 |
source | esp@cenet |
subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS OPTICS PHYSICS TESTING |
title | DYNAMIC FOCUS SYSTEM AND METHODS |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-03T16%3A14%3A14IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=WANDERS,%20Bart%20J&rft.date=2024-09-18&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP4209777B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |