PIN PUSHING INSPECTION CONNECTOR

PIN PUSHING INSPECTION CONNECTOR

A pin push inspection connector of the present disclosure includes: a first connector assembly having a front portion connected to a connector under test in a first direction and fixedly coupled to the connector under test; and a second connector assembly having a front portion connected to a rear p...

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Hauptverfasser: SUNG, Ki-Seok, CHAE, Seung-Hee, CHO, Hyun, SHIN, Dong-Ju
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator SUNG, Ki-Seok
CHAE, Seung-Hee
CHO, Hyun
SHIN, Dong-Ju
description A pin push inspection connector of the present disclosure includes: a first connector assembly having a front portion connected to a connector under test in a first direction and fixedly coupled to the connector under test; and a second connector assembly having a front portion connected to a rear portion of the first connector assembly in the first direction and provided so that a connection interval with respect to the first connector assembly is variably adjusted in the first direction or a second direction that is opposite to the first direction, wherein the second connector assembly includes at least one inspection pin provided therein to be connected to at least one terminal pin provided in the connector under test.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP4202455A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP4202455A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP4202455A13</originalsourceid><addsrcrecordid>eNrjZFAI8PRTCAgN9vD0c1fw9AsOcHUO8fT3U3D29_MDMv2DeBhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJvGuAiZGBkYmpqaOhMRFKAMYrIac</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>PIN PUSHING INSPECTION CONNECTOR</title><source>esp@cenet</source><creator>SUNG, Ki-Seok ; CHAE, Seung-Hee ; CHO, Hyun ; SHIN, Dong-Ju</creator><creatorcontrib>SUNG, Ki-Seok ; CHAE, Seung-Hee ; CHO, Hyun ; SHIN, Dong-Ju</creatorcontrib><description>A pin push inspection connector of the present disclosure includes: a first connector assembly having a front portion connected to a connector under test in a first direction and fixedly coupled to the connector under test; and a second connector assembly having a front portion connected to a rear portion of the first connector assembly in the first direction and provided so that a connection interval with respect to the first connector assembly is variably adjusted in the first direction or a second direction that is opposite to the first direction, wherein the second connector assembly includes at least one inspection pin provided therein to be connected to at least one terminal pin provided in the connector under test.</description><language>eng ; fre ; ger</language><subject>MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230628&amp;DB=EPODOC&amp;CC=EP&amp;NR=4202455A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20230628&amp;DB=EPODOC&amp;CC=EP&amp;NR=4202455A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>SUNG, Ki-Seok</creatorcontrib><creatorcontrib>CHAE, Seung-Hee</creatorcontrib><creatorcontrib>CHO, Hyun</creatorcontrib><creatorcontrib>SHIN, Dong-Ju</creatorcontrib><title>PIN PUSHING INSPECTION CONNECTOR</title><description>A pin push inspection connector of the present disclosure includes: a first connector assembly having a front portion connected to a connector under test in a first direction and fixedly coupled to the connector under test; and a second connector assembly having a front portion connected to a rear portion of the first connector assembly in the first direction and provided so that a connection interval with respect to the first connector assembly is variably adjusted in the first direction or a second direction that is opposite to the first direction, wherein the second connector assembly includes at least one inspection pin provided therein to be connected to at least one terminal pin provided in the connector under test.</description><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFAI8PRTCAgN9vD0c1fw9AsOcHUO8fT3U3D29_MDMv2DeBhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJvGuAiZGBkYmpqaOhMRFKAMYrIac</recordid><startdate>20230628</startdate><enddate>20230628</enddate><creator>SUNG, Ki-Seok</creator><creator>CHAE, Seung-Hee</creator><creator>CHO, Hyun</creator><creator>SHIN, Dong-Ju</creator><scope>EVB</scope></search><sort><creationdate>20230628</creationdate><title>PIN PUSHING INSPECTION CONNECTOR</title><author>SUNG, Ki-Seok ; CHAE, Seung-Hee ; CHO, Hyun ; SHIN, Dong-Ju</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4202455A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2023</creationdate><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>SUNG, Ki-Seok</creatorcontrib><creatorcontrib>CHAE, Seung-Hee</creatorcontrib><creatorcontrib>CHO, Hyun</creatorcontrib><creatorcontrib>SHIN, Dong-Ju</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>SUNG, Ki-Seok</au><au>CHAE, Seung-Hee</au><au>CHO, Hyun</au><au>SHIN, Dong-Ju</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>PIN PUSHING INSPECTION CONNECTOR</title><date>2023-06-28</date><risdate>2023</risdate><abstract>A pin push inspection connector of the present disclosure includes: a first connector assembly having a front portion connected to a connector under test in a first direction and fixedly coupled to the connector under test; and a second connector assembly having a front portion connected to a rear portion of the first connector assembly in the first direction and provided so that a connection interval with respect to the first connector assembly is variably adjusted in the first direction or a second direction that is opposite to the first direction, wherein the second connector assembly includes at least one inspection pin provided therein to be connected to at least one terminal pin provided in the connector under test.</abstract><oa>free_for_read</oa></addata></record>
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language eng ; fre ; ger
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subjects MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title PIN PUSHING INSPECTION CONNECTOR
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-25T00%3A50%3A41IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=SUNG,%20Ki-Seok&rft.date=2023-06-28&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP4202455A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true