WAFER EDGE TEMPERATURE CORRECTION IN BATCH THERMAL PROCESS CHAMBER

A process kit for use in a processing chamber includes an outer liner, an inner liner configured to be in fluid communication with a gas injection assembly and a gas exhaust assembly of a processing chamber, a first ring reflector disposed between the outer liner and the inner liner, a top plate and...

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Bibliographische Detailangaben
Hauptverfasser: CHU, Schubert S, MORADIAN, Ala, PANDEY, Vishwas Kumar, KUMAR, Surajit, BURROWS, Brian Hayes, LAU, Shu-Kwan, TANNOUS, Adel George, RANGAPPA, Srinivasa, SHAH, Kartik Bhupendra, MYO, Nyi O, ZHU, Zuoming
Format: Patent
Sprache:eng ; fre ; ger
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