X-RAY ANALYSIS APPARATUS

An X-ray analyzer includes a sample container (10) configured to accommodate a sample (S), a placement portion (24) capable of placing the sample container (10) thereon, an X-ray irradiation source configured to irradiate the sample (S) with X-rays from below the placement portion (24), a detector c...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: TANTRAKARN, Kriengkamol, MORIHISA, Yuji, SUZUKI, Keijiro, KOBAYASHI, Kanji
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator TANTRAKARN, Kriengkamol
MORIHISA, Yuji
SUZUKI, Keijiro
KOBAYASHI, Kanji
description An X-ray analyzer includes a sample container (10) configured to accommodate a sample (S), a placement portion (24) capable of placing the sample container (10) thereon, an X-ray irradiation source configured to irradiate the sample (S) with X-rays from below the placement portion (24), a detector configured to detect fluorescent X-rays generated from the sample (S) below the placement portion, and a holder (50) placed on the placement portion (24), the holder (50) being configured to accommodate the sample container (10). The placement portion (24) is provided with an opening (24h). The sample container (10) includes a container body (12) configured to surround the sample (S), the container body is formed in a shape having an opening opened downward, and a container film (14) configured to close the opening of the container body (12) and support the sample (S). The holder (50) includes an enclosure cylinder (52) having an outer shape larger than the opening (24h), the enclosure cylinder being configured to surround the sample container (10), the enclosure cylinder being formed in a shape having an opening opened downward, and a holder film (54) closing the opening of the enclosure cylinder (52).
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP4177600A4</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP4177600A4</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP4177600A43</originalsourceid><addsrcrecordid>eNrjZJCI0A1yjFRw9HP0iQz2DFZwDAhwDHIMCQ3mYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxrgEmhubmZgYGjibGRCgBAL3KH2U</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>X-RAY ANALYSIS APPARATUS</title><source>esp@cenet</source><creator>TANTRAKARN, Kriengkamol ; MORIHISA, Yuji ; SUZUKI, Keijiro ; KOBAYASHI, Kanji</creator><creatorcontrib>TANTRAKARN, Kriengkamol ; MORIHISA, Yuji ; SUZUKI, Keijiro ; KOBAYASHI, Kanji</creatorcontrib><description>An X-ray analyzer includes a sample container (10) configured to accommodate a sample (S), a placement portion (24) capable of placing the sample container (10) thereon, an X-ray irradiation source configured to irradiate the sample (S) with X-rays from below the placement portion (24), a detector configured to detect fluorescent X-rays generated from the sample (S) below the placement portion, and a holder (50) placed on the placement portion (24), the holder (50) being configured to accommodate the sample container (10). The placement portion (24) is provided with an opening (24h). The sample container (10) includes a container body (12) configured to surround the sample (S), the container body is formed in a shape having an opening opened downward, and a container film (14) configured to close the opening of the container body (12) and support the sample (S). The holder (50) includes an enclosure cylinder (52) having an outer shape larger than the opening (24h), the enclosure cylinder being configured to surround the sample container (10), the enclosure cylinder being formed in a shape having an opening opened downward, and a holder film (54) closing the opening of the enclosure cylinder (52).</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240306&amp;DB=EPODOC&amp;CC=EP&amp;NR=4177600A4$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25543,76293</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240306&amp;DB=EPODOC&amp;CC=EP&amp;NR=4177600A4$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>TANTRAKARN, Kriengkamol</creatorcontrib><creatorcontrib>MORIHISA, Yuji</creatorcontrib><creatorcontrib>SUZUKI, Keijiro</creatorcontrib><creatorcontrib>KOBAYASHI, Kanji</creatorcontrib><title>X-RAY ANALYSIS APPARATUS</title><description>An X-ray analyzer includes a sample container (10) configured to accommodate a sample (S), a placement portion (24) capable of placing the sample container (10) thereon, an X-ray irradiation source configured to irradiate the sample (S) with X-rays from below the placement portion (24), a detector configured to detect fluorescent X-rays generated from the sample (S) below the placement portion, and a holder (50) placed on the placement portion (24), the holder (50) being configured to accommodate the sample container (10). The placement portion (24) is provided with an opening (24h). The sample container (10) includes a container body (12) configured to surround the sample (S), the container body is formed in a shape having an opening opened downward, and a container film (14) configured to close the opening of the container body (12) and support the sample (S). The holder (50) includes an enclosure cylinder (52) having an outer shape larger than the opening (24h), the enclosure cylinder being configured to surround the sample container (10), the enclosure cylinder being formed in a shape having an opening opened downward, and a holder film (54) closing the opening of the enclosure cylinder (52).</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJCI0A1yjFRw9HP0iQz2DFZwDAhwDHIMCQ3mYWBNS8wpTuWF0twMCm6uIc4euqkF-fGpxQWJyal5qSXxrgEmhubmZgYGjibGRCgBAL3KH2U</recordid><startdate>20240306</startdate><enddate>20240306</enddate><creator>TANTRAKARN, Kriengkamol</creator><creator>MORIHISA, Yuji</creator><creator>SUZUKI, Keijiro</creator><creator>KOBAYASHI, Kanji</creator><scope>EVB</scope></search><sort><creationdate>20240306</creationdate><title>X-RAY ANALYSIS APPARATUS</title><author>TANTRAKARN, Kriengkamol ; MORIHISA, Yuji ; SUZUKI, Keijiro ; KOBAYASHI, Kanji</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4177600A43</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>TANTRAKARN, Kriengkamol</creatorcontrib><creatorcontrib>MORIHISA, Yuji</creatorcontrib><creatorcontrib>SUZUKI, Keijiro</creatorcontrib><creatorcontrib>KOBAYASHI, Kanji</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>TANTRAKARN, Kriengkamol</au><au>MORIHISA, Yuji</au><au>SUZUKI, Keijiro</au><au>KOBAYASHI, Kanji</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>X-RAY ANALYSIS APPARATUS</title><date>2024-03-06</date><risdate>2024</risdate><abstract>An X-ray analyzer includes a sample container (10) configured to accommodate a sample (S), a placement portion (24) capable of placing the sample container (10) thereon, an X-ray irradiation source configured to irradiate the sample (S) with X-rays from below the placement portion (24), a detector configured to detect fluorescent X-rays generated from the sample (S) below the placement portion, and a holder (50) placed on the placement portion (24), the holder (50) being configured to accommodate the sample container (10). The placement portion (24) is provided with an opening (24h). The sample container (10) includes a container body (12) configured to surround the sample (S), the container body is formed in a shape having an opening opened downward, and a container film (14) configured to close the opening of the container body (12) and support the sample (S). The holder (50) includes an enclosure cylinder (52) having an outer shape larger than the opening (24h), the enclosure cylinder being configured to surround the sample container (10), the enclosure cylinder being formed in a shape having an opening opened downward, and a holder film (54) closing the opening of the enclosure cylinder (52).</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP4177600A4
source esp@cenet
subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title X-RAY ANALYSIS APPARATUS
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-26T12%3A59%3A51IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=TANTRAKARN,%20Kriengkamol&rft.date=2024-03-06&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP4177600A4%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true