AUTOMATIC KERF OFFSET MAPPING AND CORRECTION SYSTEM FOR LASER DICING
Embodiments of the present disclosure include methods of determining scribing offsets in a hybrid laser scribing and plasma dicing process. In an embodiment, the method comprises forming a mask above a semiconductor wafer. In an embodiment, the semiconductor wafer comprises a plurality of dies separ...
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Sprache: | eng ; fre ; ger |
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