TESTING CHIP AND METHOD FOR MANUFACTURING SAME

TESTING CHIP AND METHOD FOR MANUFACTURING SAME

Provided is a test chip capable of significantly suppressing unevenness in the color development. The test chip includes a sheet shape and includes a first layer on a front side and a second layer on a back side, wherein the first layer and the second layer are located adjacent to each other. One of...

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Hauptverfasser: MONJU Takuya, SUMA Motoki
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator MONJU Takuya
SUMA Motoki
description Provided is a test chip capable of significantly suppressing unevenness in the color development. The test chip includes a sheet shape and includes a first layer on a front side and a second layer on a back side, wherein the first layer and the second layer are located adjacent to each other. One of the first layer and the second layer has a liquid receiving section A. The first layer has at least a detection confirmation section B. The second layer has at least a liquid flow section D adjacent to the detection confirmation section B and a liquid passage E connected to the liquid flow section D. The test chip is configured such that, in case where the liquid receiving section A is provided in the first layer, the liquid receiving section A is spaced from the detection confirmation section B and a test liquid dropped into the liquid receiving section A passes through the liquid receiving section A, the liquid passage E, and the liquid flow section D in the stated order, by means of capillary action, and flows to the detection confirmation section B.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title TESTING CHIP AND METHOD FOR MANUFACTURING SAME
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