SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A SURFACE MOVING RELATIVE TO THE SYSTEM

SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A SURFACE MOVING RELATIVE TO THE SYSTEM

A system (1) for generating a signal from a surface (22) having a speed V in a direction U, comprising: a light source (2) emitting a Gaussian light beam along a first optical path (11); a sensor (3) able to evaluate the effects of the electromagnetic interference of the first beam; a means (2′, 4)...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: BREMOND, Florian, BOSCH, Thierry, GRIMALDI, Bastien, BONY, Francis, COTE, Remi
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator BREMOND, Florian
BOSCH, Thierry
GRIMALDI, Bastien
BONY, Francis
COTE, Remi
description A system (1) for generating a signal from a surface (22) having a speed V in a direction U, comprising: a light source (2) emitting a Gaussian light beam along a first optical path (11); a sensor (3) able to evaluate the effects of the electromagnetic interference of the first beam; a means (2′, 4) for generating a second Gaussian light beam along a second optical path (12); a second sensor (3′) able to evaluate the effects of electromagnetic interference of the second beam; a focusing lens (5, 6) located on the first and/or the second optical path (11, 12), focusing the light beam at a distance f and defining an upstream optical path (11′, 12′); and a means (4′, 7) for routing the second beam able to redirect the second path (12′) in the direction of the first path (11′).
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP4143504B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP4143504B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP4143504B13</originalsourceid><addsrcrecordid>eNrjZEgPjgwOcfVVcPMPUnB39XMNcgzx9HNXcFQI9nT3c_RRCHINCHINdvULAYqHuSr4uymEeLgqBAT5u3n6gLlAlaFBbo7Orgq-_mEgrUGuPhC1If5gtRALeBhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJvGuAiaGJsamBiZOhMRFKAHDhNL0</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A SURFACE MOVING RELATIVE TO THE SYSTEM</title><source>esp@cenet</source><creator>BREMOND, Florian ; BOSCH, Thierry ; GRIMALDI, Bastien ; BONY, Francis ; COTE, Remi</creator><creatorcontrib>BREMOND, Florian ; BOSCH, Thierry ; GRIMALDI, Bastien ; BONY, Francis ; COTE, Remi</creatorcontrib><description>A system (1) for generating a signal from a surface (22) having a speed V in a direction U, comprising: a light source (2) emitting a Gaussian light beam along a first optical path (11); a sensor (3) able to evaluate the effects of the electromagnetic interference of the first beam; a means (2′, 4) for generating a second Gaussian light beam along a second optical path (12); a second sensor (3′) able to evaluate the effects of electromagnetic interference of the second beam; a focusing lens (5, 6) located on the first and/or the second optical path (11, 12), focusing the light beam at a distance f and defining an upstream optical path (11′, 12′); and a means (4′, 7) for routing the second beam able to redirect the second path (12′) in the direction of the first path (11′).</description><language>eng ; fre ; ger</language><subject>MEASURING ; MEASURING ANGLES ; MEASURING AREAS ; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS ; MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240904&amp;DB=EPODOC&amp;CC=EP&amp;NR=4143504B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76290</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20240904&amp;DB=EPODOC&amp;CC=EP&amp;NR=4143504B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BREMOND, Florian</creatorcontrib><creatorcontrib>BOSCH, Thierry</creatorcontrib><creatorcontrib>GRIMALDI, Bastien</creatorcontrib><creatorcontrib>BONY, Francis</creatorcontrib><creatorcontrib>COTE, Remi</creatorcontrib><title>SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A SURFACE MOVING RELATIVE TO THE SYSTEM</title><description>A system (1) for generating a signal from a surface (22) having a speed V in a direction U, comprising: a light source (2) emitting a Gaussian light beam along a first optical path (11); a sensor (3) able to evaluate the effects of the electromagnetic interference of the first beam; a means (2′, 4) for generating a second Gaussian light beam along a second optical path (12); a second sensor (3′) able to evaluate the effects of electromagnetic interference of the second beam; a focusing lens (5, 6) located on the first and/or the second optical path (11, 12), focusing the light beam at a distance f and defining an upstream optical path (11′, 12′); and a means (4′, 7) for routing the second beam able to redirect the second path (12′) in the direction of the first path (11′).</description><subject>MEASURING</subject><subject>MEASURING ANGLES</subject><subject>MEASURING AREAS</subject><subject>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</subject><subject>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZEgPjgwOcfVVcPMPUnB39XMNcgzx9HNXcFQI9nT3c_RRCHINCHINdvULAYqHuSr4uymEeLgqBAT5u3n6gLlAlaFBbo7Orgq-_mEgrUGuPhC1If5gtRALeBhY0xJzilN5oTQ3g4Kba4izh25qQX58anFBYnJqXmpJvGuAiaGJsamBiZOhMRFKAHDhNL0</recordid><startdate>20240904</startdate><enddate>20240904</enddate><creator>BREMOND, Florian</creator><creator>BOSCH, Thierry</creator><creator>GRIMALDI, Bastien</creator><creator>BONY, Francis</creator><creator>COTE, Remi</creator><scope>EVB</scope></search><sort><creationdate>20240904</creationdate><title>SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A SURFACE MOVING RELATIVE TO THE SYSTEM</title><author>BREMOND, Florian ; BOSCH, Thierry ; GRIMALDI, Bastien ; BONY, Francis ; COTE, Remi</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4143504B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2024</creationdate><topic>MEASURING</topic><topic>MEASURING ANGLES</topic><topic>MEASURING AREAS</topic><topic>MEASURING IRREGULARITIES OF SURFACES OR CONTOURS</topic><topic>MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>BREMOND, Florian</creatorcontrib><creatorcontrib>BOSCH, Thierry</creatorcontrib><creatorcontrib>GRIMALDI, Bastien</creatorcontrib><creatorcontrib>BONY, Francis</creatorcontrib><creatorcontrib>COTE, Remi</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BREMOND, Florian</au><au>BOSCH, Thierry</au><au>GRIMALDI, Bastien</au><au>BONY, Francis</au><au>COTE, Remi</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A SURFACE MOVING RELATIVE TO THE SYSTEM</title><date>2024-09-04</date><risdate>2024</risdate><abstract>A system (1) for generating a signal from a surface (22) having a speed V in a direction U, comprising: a light source (2) emitting a Gaussian light beam along a first optical path (11); a sensor (3) able to evaluate the effects of the electromagnetic interference of the first beam; a means (2′, 4) for generating a second Gaussian light beam along a second optical path (12); a second sensor (3′) able to evaluate the effects of electromagnetic interference of the second beam; a focusing lens (5, 6) located on the first and/or the second optical path (11, 12), focusing the light beam at a distance f and defining an upstream optical path (11′, 12′); and a means (4′, 7) for routing the second beam able to redirect the second path (12′) in the direction of the first path (11′).</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP4143504B1
source esp@cenet
subjects MEASURING
MEASURING ANGLES
MEASURING AREAS
MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
MEASURING LENGTH, THICKNESS OR SIMILAR LINEARDIMENSIONS
PHYSICS
TESTING
title SYSTEM FOR GENERATING A SIGNAL REPRESENTATIVE OF THE PROFILE OF A SURFACE MOVING RELATIVE TO THE SYSTEM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-28T23%3A42%3A47IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=BREMOND,%20Florian&rft.date=2024-09-04&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP4143504B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true