MEASURING JIG, AND CALIBRATION METHOD AND TERAHERTZ WAVE MEASURING METHOD USING SAME

The invention is configured to include a spectroscopy cell 100 as a container including one or more spaces, each of which has a plate shape and contains a to-be-measured object that transmits or reflects a terahertz wave; and a holder 6 including one or more first holder through-holes 6b and 6c disp...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	OKUNO, Tadashi, WATANABE, Akira, UEDA, Takeji
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
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