X-RAY SCATTERING APPARATUS AND X-RAY SCATTERING METHOD

The invention refers to an X-ray scattering apparatus (10), comprising:- a sample vacuum chamber (26);- a sample holder (20) placed inside the sample vacuum chamber (26) for aligning and/or orienting a sample (18) to be analyzed by X-ray scattering;- an X-ray beam delivery system (11) comprising a 2...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	PANINE, Pierre, JOENSEN, Karsten, HOGHOJ, Peter
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	GAMMA RAY OR X-RAY MICROSCOPES INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES IRRADIATION DEVICES MEASURING NUCLEAR ENGINEERING NUCLEAR PHYSICS PHYSICS TECHNIQUES FOR HANDLING PARTICLES OR IONISING RADIATION NOTOTHERWISE PROVIDED FOR TESTING
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