DETECTION OF BAD DETECTORS AT IDLE STATE

DETECTION OF BAD DETECTORS AT IDLE STATE

A fault checker system for an X-ray detector, comprising an input interface (IN) for receiving readings acquired by a target detector pixel not exposed to X-radiation. A converter (CV) is configured to convert the readings into a metric. A thresholder (CP) is configured to compare the metric against...

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Hauptverfasser: FINZI, David, BERENT, Inon
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
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creator FINZI, David
BERENT, Inon
description A fault checker system for an X-ray detector, comprising an input interface (IN) for receiving readings acquired by a target detector pixel not exposed to X-radiation. A converter (CV) is configured to convert the readings into a metric. A thresholder (CP) is configured to compare the metric against at least one threshold and, based on the comparing, provide an indication on whether the detector pixel is faulty.
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subjects MEASUREMENT OF NUCLEAR OR X-RADIATION
MEASURING
PHYSICS
TESTING
title DETECTION OF BAD DETECTORS AT IDLE STATE
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