MATCHING BOTH DYNAMIC AND STATIC PARAMETERS IN DIES, DISCRETES, AND/OR MODULES

A device binning and/or matching process includes measuring with a testing device currents and/or voltages of a device with respect to time, determining with the testing device binning and/or matching criteria for the device based on transfer data generated from the device currents and/or the voltag...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	CURBOW, William Austin, MARTIN, Daniel John
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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