AN APPARATUS AND A METHOD FOR MEASURING A DEVICE CURRENT OF A DEVICE UNDER TEST

An apparatus for measuring a device current of a device under test comprises a first circuit including a first terminal for coupling to a first connection terminal of the DUT. The first circuit is configured to supply a first test voltage for the first terminal and to output a first output voltage s...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SCHAFFER, Josef-Paul, WILLEMEN, Joost Adriaan
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	MEASURING MEASURING ELECTRIC VARIABLES MEASURING MAGNETIC VARIABLES PHYSICS TESTING
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