TRANSLATION DEVICE, TEST SYSTEM INCLUDING THE SAME, AND MEMORY SYSTEM INCLUDING THE TRANSLATION DEVICE

TRANSLATION DEVICE, TEST SYSTEM INCLUDING THE SAME, AND MEMORY SYSTEM INCLUDING THE TRANSLATION DEVICE

A translation device, a test system, and a memory system are provided. The translation device includes plural first input/output (I/O) circuits that respectively transmit and receive first signals through plural pins based on a pulse amplitude modulation (PAM)-M mode, a second I/O circuit that trans...

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Hauptverfasser: JIN, Hyungmin, SON, Younghoon, CHOI, Junghwan, CHO, Hyunyoon, CHOI, Youngdon
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
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creator JIN, Hyungmin
SON, Younghoon
CHOI, Junghwan
CHO, Hyunyoon
CHOI, Youngdon
description A translation device, a test system, and a memory system are provided. The translation device includes plural first input/output (I/O) circuits that respectively transmit and receive first signals through plural pins based on a pulse amplitude modulation (PAM)-M mode, a second I/O circuit that transmits and receives a second signal through one or more pins based on a PAM-N mode, and a translation circuit that translates the first signals into the second signal and translates the second signal into the first signals. M and N are different integers of 2 or more.
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subjects CALCULATING
COMPUTING
COUNTING
ELECTRIC DIGITAL DATA PROCESSING
PHYSICS
title TRANSLATION DEVICE, TEST SYSTEM INCLUDING THE SAME, AND MEMORY SYSTEM INCLUDING THE TRANSLATION DEVICE
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