ELECTROSTATIC PARTICLE SENSOR
The present disclosure is directed to a sensor assembly. The sensor assembly comprising at least one electrostatic sensor. The electrostatic sensor comprising an outer housing and an electrode configured at least partially within the outer housing. The electrode comprising a first end and a second e...
Gespeichert in:
Hauptverfasser: | , , , , , , |
---|---|
Format: | Patent |
Sprache: | eng ; fre ; ger |
Schlagworte: | |
Online-Zugang: | Volltext bestellen |
Tags: |
Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
|
container_end_page | |
---|---|
container_issue | |
container_start_page | |
container_title | |
container_volume | |
creator | NOEL, James BROWN, Joshua Daniel KESSIE, Andrew Scott GRIFFIN, Gregory SMITH, Philip RICKARDS, Charles WEICKERT, John David |
description | The present disclosure is directed to a sensor assembly. The sensor assembly comprising at least one electrostatic sensor. The electrostatic sensor comprising an outer housing and an electrode configured at least partially within the outer housing. The electrode comprising a first end and a second end separated by a predetermined length, the first end secured within the outer housing and the second end comprising a sensing face that extends beyond an edge of the outer housing. Further, the electrode comprises a plurality of electrons configured to respond to one or more charged particles that flow past the sensing face by moving either towards or away from the second end, and an amplifier configured within the outer housing and electrically coupled to the electrode, the amplifier configured to detect a particle level flowing past the sensing face as a function of electron movement. A circuit board is electrically coupled to the sensor via a cable. |
format | Patent |
fullrecord | <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP4001894B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP4001894B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP4001894B13</originalsourceid><addsrcrecordid>eNrjZJB19XF1DgnyDw5xDPF0VghwDAJSPq4Kwa5-wf5BPAysaYk5xam8UJqbQcHNNcTZQze1ID8-tbggMTk1L7Uk3jXAxMDA0MLSxMnQmAglAGpZIOY</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>ELECTROSTATIC PARTICLE SENSOR</title><source>esp@cenet</source><creator>NOEL, James ; BROWN, Joshua Daniel ; KESSIE, Andrew Scott ; GRIFFIN, Gregory ; SMITH, Philip ; RICKARDS, Charles ; WEICKERT, John David</creator><creatorcontrib>NOEL, James ; BROWN, Joshua Daniel ; KESSIE, Andrew Scott ; GRIFFIN, Gregory ; SMITH, Philip ; RICKARDS, Charles ; WEICKERT, John David</creatorcontrib><description>The present disclosure is directed to a sensor assembly. The sensor assembly comprising at least one electrostatic sensor. The electrostatic sensor comprising an outer housing and an electrode configured at least partially within the outer housing. The electrode comprising a first end and a second end separated by a predetermined length, the first end secured within the outer housing and the second end comprising a sensing face that extends beyond an edge of the outer housing. Further, the electrode comprises a plurality of electrons configured to respond to one or more charged particles that flow past the sensing face by moving either towards or away from the second end, and an amplifier configured within the outer housing and electrically coupled to the electrode, the amplifier configured to detect a particle level flowing past the sensing face as a function of electron movement. A circuit board is electrically coupled to the sensor via a cable.</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; PHYSICS ; TESTING</subject><creationdate>2024</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241106&DB=EPODOC&CC=EP&NR=4001894B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&date=20241106&DB=EPODOC&CC=EP&NR=4001894B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>NOEL, James</creatorcontrib><creatorcontrib>BROWN, Joshua Daniel</creatorcontrib><creatorcontrib>KESSIE, Andrew Scott</creatorcontrib><creatorcontrib>GRIFFIN, Gregory</creatorcontrib><creatorcontrib>SMITH, Philip</creatorcontrib><creatorcontrib>RICKARDS, Charles</creatorcontrib><creatorcontrib>WEICKERT, John David</creatorcontrib><title>ELECTROSTATIC PARTICLE SENSOR</title><description>The present disclosure is directed to a sensor assembly. The sensor assembly comprising at least one electrostatic sensor. The electrostatic sensor comprising an outer housing and an electrode configured at least partially within the outer housing. The electrode comprising a first end and a second end separated by a predetermined length, the first end secured within the outer housing and the second end comprising a sensing face that extends beyond an edge of the outer housing. Further, the electrode comprises a plurality of electrons configured to respond to one or more charged particles that flow past the sensing face by moving either towards or away from the second end, and an amplifier configured within the outer housing and electrically coupled to the electrode, the amplifier configured to detect a particle level flowing past the sensing face as a function of electron movement. A circuit board is electrically coupled to the sensor via a cable.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2024</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZJB19XF1DgnyDw5xDPF0VghwDAJSPq4Kwa5-wf5BPAysaYk5xam8UJqbQcHNNcTZQze1ID8-tbggMTk1L7Uk3jXAxMDA0MLSxMnQmAglAGpZIOY</recordid><startdate>20241106</startdate><enddate>20241106</enddate><creator>NOEL, James</creator><creator>BROWN, Joshua Daniel</creator><creator>KESSIE, Andrew Scott</creator><creator>GRIFFIN, Gregory</creator><creator>SMITH, Philip</creator><creator>RICKARDS, Charles</creator><creator>WEICKERT, John David</creator><scope>EVB</scope></search><sort><creationdate>20241106</creationdate><title>ELECTROSTATIC PARTICLE SENSOR</title><author>NOEL, James ; BROWN, Joshua Daniel ; KESSIE, Andrew Scott ; GRIFFIN, Gregory ; SMITH, Philip ; RICKARDS, Charles ; WEICKERT, John David</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP4001894B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2024</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>NOEL, James</creatorcontrib><creatorcontrib>BROWN, Joshua Daniel</creatorcontrib><creatorcontrib>KESSIE, Andrew Scott</creatorcontrib><creatorcontrib>GRIFFIN, Gregory</creatorcontrib><creatorcontrib>SMITH, Philip</creatorcontrib><creatorcontrib>RICKARDS, Charles</creatorcontrib><creatorcontrib>WEICKERT, John David</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>NOEL, James</au><au>BROWN, Joshua Daniel</au><au>KESSIE, Andrew Scott</au><au>GRIFFIN, Gregory</au><au>SMITH, Philip</au><au>RICKARDS, Charles</au><au>WEICKERT, John David</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>ELECTROSTATIC PARTICLE SENSOR</title><date>2024-11-06</date><risdate>2024</risdate><abstract>The present disclosure is directed to a sensor assembly. The sensor assembly comprising at least one electrostatic sensor. The electrostatic sensor comprising an outer housing and an electrode configured at least partially within the outer housing. The electrode comprising a first end and a second end separated by a predetermined length, the first end secured within the outer housing and the second end comprising a sensing face that extends beyond an edge of the outer housing. Further, the electrode comprises a plurality of electrons configured to respond to one or more charged particles that flow past the sensing face by moving either towards or away from the second end, and an amplifier configured within the outer housing and electrically coupled to the electrode, the amplifier configured to detect a particle level flowing past the sensing face as a function of electron movement. A circuit board is electrically coupled to the sensor via a cable.</abstract><oa>free_for_read</oa></addata></record> |
fulltext | fulltext_linktorsrc |
identifier | |
ispartof | |
issn | |
language | eng ; fre ; ger |
recordid | cdi_epo_espacenet_EP4001894B1 |
source | esp@cenet |
subjects | INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING |
title | ELECTROSTATIC PARTICLE SENSOR |
url | https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2024-12-28T01%3A29%3A28IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=NOEL,%20James&rft.date=2024-11-06&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP4001894B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true |