SEMICONDUCTOR CHIP WITH LOCAL OSCILLATOR BUFFER REUSED FOR LOOP-BACK TEST AND ASSOCIATED LOOP-BACK TEST METHOD

SEMICONDUCTOR CHIP WITH LOCAL OSCILLATOR BUFFER REUSED FOR LOOP-BACK TEST AND ASSOCIATED LOOP-BACK TEST METHOD

A semiconductor chip includes a first wireless communication circuit, a local oscillator (LO) buffer, and an auxiliary path. The first wireless communication circuit has a signal path, wherein the signal path has a mixer input port and a signal node distinct from the mixer input port. The auxiliary...

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Bibliographische Detailangaben
Hauptverfasser: CHU, Hsiang-Yun, CHEN, Yen-Tso, CHENG, Jen-Hao, HSU, Jui-Lin, HSU, Wei-Hsiu, LIN, Tzu-Chin, ZHAN, Jing-Hong Conan, HUNG, Chih-Ming
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
ELECTRIC COMMUNICATION TECHNIQUE
ELECTRICITY
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
TRANSMISSION
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Beschreibung
Zusammenfassung:A semiconductor chip includes a first wireless communication circuit, a local oscillator (LO) buffer, and an auxiliary path. The first wireless communication circuit has a signal path, wherein the signal path has a mixer input port and a signal node distinct from the mixer input port. The auxiliary path is used to electrically connect the LO buffer to the signal node of the signal path. The LO buffer is reused for a loop-back test function through the auxiliary path.