MAGNETIC FIELD MEASUREMENT METHOD

MAGNETIC FIELD MEASUREMENT METHOD

An ODMR member (1) is arranged in a measurement target AC magnetic field. A coil (2) applies a magnetic field of a microwave to the ODMR member (1). A high frequency power supply (3) causes the coil (2) to conduct a current of the microwave. An irradiating device (4) irradiates the ODMR member (1) w...

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Hauptverfasser: MIZUOCHI, Norikazu, YOSHII, Yoshiharu
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Sprache:eng ; fre ; ger
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INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
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creator MIZUOCHI, Norikazu
YOSHII, Yoshiharu
description An ODMR member (1) is arranged in a measurement target AC magnetic field. A coil (2) applies a magnetic field of a microwave to the ODMR member (1). A high frequency power supply (3) causes the coil (2) to conduct a current of the microwave. An irradiating device (4) irradiates the ODMR member (1) with light. A light receiving device (5) detects light that the ODMR member (1) emits. A measurement control unit (21) performs a predetermined DC magnetic field measurement sequence at a predetermined phase of the measurement target AC magnetic field, and in the DC magnetic field measurement sequence, controls the high frequency power supply (3) and the irradiating device (4) and thereby determines a detection light intensity of the light detected by the light receiving device (5). A magnetic field calculation unit (22) calculates an intensity of the measurement target AC magnetic field on the basis of the predetermined phase and the detection light intensity.
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fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3985408B1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3985408B1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3985408B13</originalsourceid><addsrcrecordid>eNrjZFD0dXT3cw3xdFZw83T1cVHwdXUMDg1y9XX1CwGyQzz8XXgYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSbxrgLGlhamJgYWToTERSgDRMiHP</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>MAGNETIC FIELD MEASUREMENT METHOD</title><source>esp@cenet</source><creator>MIZUOCHI, Norikazu ; YOSHII, Yoshiharu</creator><creatorcontrib>MIZUOCHI, Norikazu ; YOSHII, Yoshiharu</creatorcontrib><description>An ODMR member (1) is arranged in a measurement target AC magnetic field. A coil (2) applies a magnetic field of a microwave to the ODMR member (1). A high frequency power supply (3) causes the coil (2) to conduct a current of the microwave. An irradiating device (4) irradiates the ODMR member (1) with light. A light receiving device (5) detects light that the ODMR member (1) emits. A measurement control unit (21) performs a predetermined DC magnetic field measurement sequence at a predetermined phase of the measurement target AC magnetic field, and in the DC magnetic field measurement sequence, controls the high frequency power supply (3) and the irradiating device (4) and thereby determines a detection light intensity of the light detected by the light receiving device (5). A magnetic field calculation unit (22) calculates an intensity of the measurement target AC magnetic field on the basis of the predetermined phase and the detection light intensity.</description><language>eng ; fre ; ger</language><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES ; MEASURING ; MEASURING ELECTRIC VARIABLES ; MEASURING MAGNETIC VARIABLES ; PHYSICS ; TESTING</subject><creationdate>2023</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20231011&amp;DB=EPODOC&amp;CC=EP&amp;NR=3985408B1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,776,881,25542,76516</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20231011&amp;DB=EPODOC&amp;CC=EP&amp;NR=3985408B1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>MIZUOCHI, Norikazu</creatorcontrib><creatorcontrib>YOSHII, Yoshiharu</creatorcontrib><title>MAGNETIC FIELD MEASUREMENT METHOD</title><description>An ODMR member (1) is arranged in a measurement target AC magnetic field. A coil (2) applies a magnetic field of a microwave to the ODMR member (1). A high frequency power supply (3) causes the coil (2) to conduct a current of the microwave. An irradiating device (4) irradiates the ODMR member (1) with light. A light receiving device (5) detects light that the ODMR member (1) emits. A measurement control unit (21) performs a predetermined DC magnetic field measurement sequence at a predetermined phase of the measurement target AC magnetic field, and in the DC magnetic field measurement sequence, controls the high frequency power supply (3) and the irradiating device (4) and thereby determines a detection light intensity of the light detected by the light receiving device (5). A magnetic field calculation unit (22) calculates an intensity of the measurement target AC magnetic field on the basis of the predetermined phase and the detection light intensity.</description><subject>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</subject><subject>MEASURING</subject><subject>MEASURING ELECTRIC VARIABLES</subject><subject>MEASURING MAGNETIC VARIABLES</subject><subject>PHYSICS</subject><subject>TESTING</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2023</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNrjZFD0dXT3cw3xdFZw83T1cVHwdXUMDg1y9XX1CwGyQzz8XXgYWNMSc4pTeaE0N4OCm2uIs4duakF-fGpxQWJyal5qSbxrgLGlhamJgYWToTERSgDRMiHP</recordid><startdate>20231011</startdate><enddate>20231011</enddate><creator>MIZUOCHI, Norikazu</creator><creator>YOSHII, Yoshiharu</creator><scope>EVB</scope></search><sort><creationdate>20231011</creationdate><title>MAGNETIC FIELD MEASUREMENT METHOD</title><author>MIZUOCHI, Norikazu ; YOSHII, Yoshiharu</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3985408B13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2023</creationdate><topic>INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES</topic><topic>MEASURING</topic><topic>MEASURING ELECTRIC VARIABLES</topic><topic>MEASURING MAGNETIC VARIABLES</topic><topic>PHYSICS</topic><topic>TESTING</topic><toplevel>online_resources</toplevel><creatorcontrib>MIZUOCHI, Norikazu</creatorcontrib><creatorcontrib>YOSHII, Yoshiharu</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>MIZUOCHI, Norikazu</au><au>YOSHII, Yoshiharu</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>MAGNETIC FIELD MEASUREMENT METHOD</title><date>2023-10-11</date><risdate>2023</risdate><abstract>An ODMR member (1) is arranged in a measurement target AC magnetic field. A coil (2) applies a magnetic field of a microwave to the ODMR member (1). A high frequency power supply (3) causes the coil (2) to conduct a current of the microwave. An irradiating device (4) irradiates the ODMR member (1) with light. A light receiving device (5) detects light that the ODMR member (1) emits. A measurement control unit (21) performs a predetermined DC magnetic field measurement sequence at a predetermined phase of the measurement target AC magnetic field, and in the DC magnetic field measurement sequence, controls the high frequency power supply (3) and the irradiating device (4) and thereby determines a detection light intensity of the light detected by the light receiving device (5). A magnetic field calculation unit (22) calculates an intensity of the measurement target AC magnetic field on the basis of the predetermined phase and the detection light intensity.</abstract><oa>free_for_read</oa></addata></record>
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
MEASURING ELECTRIC VARIABLES
MEASURING MAGNETIC VARIABLES
PHYSICS
TESTING
title MAGNETIC FIELD MEASUREMENT METHOD
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-02-15T22%3A43%3A31IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=MIZUOCHI,%20Norikazu&rft.date=2023-10-11&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP3985408B1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true