AUTOMATED ANALYZER

Provided is an automatic analyzer in which a linear movement unit and a rotational movement unit that access to a same location can be arranged in a same plane. The automatic analyzer includes a linear movement unit configured to access to an access point by a linear movement, a rotational movement...

Ausführliche Beschreibung

Bibliographische Detailangaben

Hauptverfasser:	SUENARI, Tsukasa, OKUSA, Takenori
Format:	Patent
Sprache:	eng ; fre ; ger
Schlagworte:	INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES MEASURING PHYSICS TESTING
Online-Zugang:	Volltext bestellen
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