A METHOD AND APPARATUS FOR PROVIDING PREDICTIONS OF KEY PER-FORMANCE INDICATORS OF A COMPLEX MANUFACTURING SYSTEM

A computer-implemented method for providing predictions of key performance indicators,KPI^,of a product variant, PV, of a product family, PF, to be manufactured by a complex manufacturing system, MSYS, in a manufacturing process, MP, the method comprising the steps of providing (S1) a manufacturing...

Ausführliche Beschreibung

Gespeichert in:
Bibliographische Detailangaben
Hauptverfasser: BÄR, Felix, PAULITSCH, Christoph, BÜRGER, Niklas, SCHNITTGER, Jens, KLOS, Hans-Henning
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
Online-Zugang:Volltext bestellen
Tags: Tag hinzufügen
Keine Tags, Fügen Sie den ersten Tag hinzu!
container_end_page
container_issue
container_start_page
container_title
container_volume
creator BÄR, Felix
PAULITSCH, Christoph
BÜRGER, Niklas
SCHNITTGER, Jens
KLOS, Hans-Henning
description A computer-implemented method for providing predictions of key performance indicators,KPI^,of a product variant, PV, of a product family, PF, to be manufactured by a complex manufacturing system, MSYS, in a manufacturing process, MP, the method comprising the steps of providing (S1) a manufacturing operation model, MOpM, for each manufacturing operation type, MOT, used to manufacture a product variant, PV, of the product family, PF; providing (S2) by the complex manufacturing system, MSYS, measured contributions to key performance indicators, KPI, process context data, PCD, and process execution data, PED, of manufacturing operations, MO; learning (S3) automatically model parameters, p, of the provided manufacturing operation models, MOpM, based on collected process context data, PCD, collected process execution data, PED, and measured contributions to key performance indicators, KPI, to update the manufacturing operation models, MOpM; and evaluating (S4) an updated production efficiency model, PEM, combining updated manufacturing models, MM, including the updated manufacturing operation models, MOpM, to calculate the predictions of the key performance indicators,KPI^,of the product variant, PV, to be manufactured by said complex manufacturing system, MSYS, depending on a product configuration of the respective product variant, PV.
format Patent
fullrecord <record><control><sourceid>epo_EVB</sourceid><recordid>TN_cdi_epo_espacenet_EP3966759A1</recordid><sourceformat>XML</sourceformat><sourcesystem>PC</sourcesystem><sourcerecordid>EP3966759A1</sourcerecordid><originalsourceid>FETCH-epo_espacenet_EP3966759A13</originalsourceid><addsrcrecordid>eNqNjE0KwjAQhbtxIeod5gJdSLHS5ZBObND8kEyLXZUicSVaqffHKB7AxeM9-D7eMnsiaOLG1oAmxTn0yG0AaT04bztVK3NIi2olWFkTwEo4Ug-OfJ4kjUYQKJMwsvVfjCCsdic6Q6KtRMGt_7yEPjDpdba4jrc5bn69ykASiyaP02OI8zRe4j2-BnJFVZb7XYXb4g_lDY4TN9E</addsrcrecordid><sourcetype>Open Access Repository</sourcetype><iscdi>true</iscdi><recordtype>patent</recordtype></control><display><type>patent</type><title>A METHOD AND APPARATUS FOR PROVIDING PREDICTIONS OF KEY PER-FORMANCE INDICATORS OF A COMPLEX MANUFACTURING SYSTEM</title><source>esp@cenet</source><creator>BÄR, Felix ; PAULITSCH, Christoph ; BÜRGER, Niklas ; SCHNITTGER, Jens ; KLOS, Hans-Henning</creator><creatorcontrib>BÄR, Felix ; PAULITSCH, Christoph ; BÜRGER, Niklas ; SCHNITTGER, Jens ; KLOS, Hans-Henning</creatorcontrib><description>A computer-implemented method for providing predictions of key performance indicators,KPI^,of a product variant, PV, of a product family, PF, to be manufactured by a complex manufacturing system, MSYS, in a manufacturing process, MP, the method comprising the steps of providing (S1) a manufacturing operation model, MOpM, for each manufacturing operation type, MOT, used to manufacture a product variant, PV, of the product family, PF; providing (S2) by the complex manufacturing system, MSYS, measured contributions to key performance indicators, KPI, process context data, PCD, and process execution data, PED, of manufacturing operations, MO; learning (S3) automatically model parameters, p, of the provided manufacturing operation models, MOpM, based on collected process context data, PCD, collected process execution data, PED, and measured contributions to key performance indicators, KPI, to update the manufacturing operation models, MOpM; and evaluating (S4) an updated production efficiency model, PEM, combining updated manufacturing models, MM, including the updated manufacturing operation models, MOpM, to calculate the predictions of the key performance indicators,KPI^,of the product variant, PV, to be manufactured by said complex manufacturing system, MSYS, depending on a product configuration of the respective product variant, PV.</description><language>eng ; fre ; ger</language><subject>CALCULATING ; COMPUTING ; COUNTING ; DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES ; PHYSICS ; SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><creationdate>2022</creationdate><oa>free_for_read</oa><woscitedreferencessubscribed>false</woscitedreferencessubscribed></display><links><openurl>$$Topenurl_article</openurl><openurlfulltext>$$Topenurlfull_article</openurlfulltext><thumbnail>$$Tsyndetics_thumb_exl</thumbnail><linktohtml>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220316&amp;DB=EPODOC&amp;CC=EP&amp;NR=3966759A1$$EHTML$$P50$$Gepo$$Hfree_for_read</linktohtml><link.rule.ids>230,308,780,885,25564,76547</link.rule.ids><linktorsrc>$$Uhttps://worldwide.espacenet.com/publicationDetails/biblio?FT=D&amp;date=20220316&amp;DB=EPODOC&amp;CC=EP&amp;NR=3966759A1$$EView_record_in_European_Patent_Office$$FView_record_in_$$GEuropean_Patent_Office$$Hfree_for_read</linktorsrc></links><search><creatorcontrib>BÄR, Felix</creatorcontrib><creatorcontrib>PAULITSCH, Christoph</creatorcontrib><creatorcontrib>BÜRGER, Niklas</creatorcontrib><creatorcontrib>SCHNITTGER, Jens</creatorcontrib><creatorcontrib>KLOS, Hans-Henning</creatorcontrib><title>A METHOD AND APPARATUS FOR PROVIDING PREDICTIONS OF KEY PER-FORMANCE INDICATORS OF A COMPLEX MANUFACTURING SYSTEM</title><description>A computer-implemented method for providing predictions of key performance indicators,KPI^,of a product variant, PV, of a product family, PF, to be manufactured by a complex manufacturing system, MSYS, in a manufacturing process, MP, the method comprising the steps of providing (S1) a manufacturing operation model, MOpM, for each manufacturing operation type, MOT, used to manufacture a product variant, PV, of the product family, PF; providing (S2) by the complex manufacturing system, MSYS, measured contributions to key performance indicators, KPI, process context data, PCD, and process execution data, PED, of manufacturing operations, MO; learning (S3) automatically model parameters, p, of the provided manufacturing operation models, MOpM, based on collected process context data, PCD, collected process execution data, PED, and measured contributions to key performance indicators, KPI, to update the manufacturing operation models, MOpM; and evaluating (S4) an updated production efficiency model, PEM, combining updated manufacturing models, MM, including the updated manufacturing operation models, MOpM, to calculate the predictions of the key performance indicators,KPI^,of the product variant, PV, to be manufactured by said complex manufacturing system, MSYS, depending on a product configuration of the respective product variant, PV.</description><subject>CALCULATING</subject><subject>COMPUTING</subject><subject>COUNTING</subject><subject>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</subject><subject>PHYSICS</subject><subject>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</subject><fulltext>true</fulltext><rsrctype>patent</rsrctype><creationdate>2022</creationdate><recordtype>patent</recordtype><sourceid>EVB</sourceid><recordid>eNqNjE0KwjAQhbtxIeod5gJdSLHS5ZBObND8kEyLXZUicSVaqffHKB7AxeM9-D7eMnsiaOLG1oAmxTn0yG0AaT04bztVK3NIi2olWFkTwEo4Ug-OfJ4kjUYQKJMwsvVfjCCsdic6Q6KtRMGt_7yEPjDpdba4jrc5bn69ykASiyaP02OI8zRe4j2-BnJFVZb7XYXb4g_lDY4TN9E</recordid><startdate>20220316</startdate><enddate>20220316</enddate><creator>BÄR, Felix</creator><creator>PAULITSCH, Christoph</creator><creator>BÜRGER, Niklas</creator><creator>SCHNITTGER, Jens</creator><creator>KLOS, Hans-Henning</creator><scope>EVB</scope></search><sort><creationdate>20220316</creationdate><title>A METHOD AND APPARATUS FOR PROVIDING PREDICTIONS OF KEY PER-FORMANCE INDICATORS OF A COMPLEX MANUFACTURING SYSTEM</title><author>BÄR, Felix ; PAULITSCH, Christoph ; BÜRGER, Niklas ; SCHNITTGER, Jens ; KLOS, Hans-Henning</author></sort><facets><frbrtype>5</frbrtype><frbrgroupid>cdi_FETCH-epo_espacenet_EP3966759A13</frbrgroupid><rsrctype>patents</rsrctype><prefilter>patents</prefilter><language>eng ; fre ; ger</language><creationdate>2022</creationdate><topic>CALCULATING</topic><topic>COMPUTING</topic><topic>COUNTING</topic><topic>DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES</topic><topic>PHYSICS</topic><topic>SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR</topic><toplevel>online_resources</toplevel><creatorcontrib>BÄR, Felix</creatorcontrib><creatorcontrib>PAULITSCH, Christoph</creatorcontrib><creatorcontrib>BÜRGER, Niklas</creatorcontrib><creatorcontrib>SCHNITTGER, Jens</creatorcontrib><creatorcontrib>KLOS, Hans-Henning</creatorcontrib><collection>esp@cenet</collection></facets><delivery><delcategory>Remote Search Resource</delcategory><fulltext>fulltext_linktorsrc</fulltext></delivery><addata><au>BÄR, Felix</au><au>PAULITSCH, Christoph</au><au>BÜRGER, Niklas</au><au>SCHNITTGER, Jens</au><au>KLOS, Hans-Henning</au><format>patent</format><genre>patent</genre><ristype>GEN</ristype><title>A METHOD AND APPARATUS FOR PROVIDING PREDICTIONS OF KEY PER-FORMANCE INDICATORS OF A COMPLEX MANUFACTURING SYSTEM</title><date>2022-03-16</date><risdate>2022</risdate><abstract>A computer-implemented method for providing predictions of key performance indicators,KPI^,of a product variant, PV, of a product family, PF, to be manufactured by a complex manufacturing system, MSYS, in a manufacturing process, MP, the method comprising the steps of providing (S1) a manufacturing operation model, MOpM, for each manufacturing operation type, MOT, used to manufacture a product variant, PV, of the product family, PF; providing (S2) by the complex manufacturing system, MSYS, measured contributions to key performance indicators, KPI, process context data, PCD, and process execution data, PED, of manufacturing operations, MO; learning (S3) automatically model parameters, p, of the provided manufacturing operation models, MOpM, based on collected process context data, PCD, collected process execution data, PED, and measured contributions to key performance indicators, KPI, to update the manufacturing operation models, MOpM; and evaluating (S4) an updated production efficiency model, PEM, combining updated manufacturing models, MM, including the updated manufacturing operation models, MOpM, to calculate the predictions of the key performance indicators,KPI^,of the product variant, PV, to be manufactured by said complex manufacturing system, MSYS, depending on a product configuration of the respective product variant, PV.</abstract><oa>free_for_read</oa></addata></record>
fulltext fulltext_linktorsrc
identifier
ispartof
issn
language eng ; fre ; ger
recordid cdi_epo_espacenet_EP3966759A1
source esp@cenet
subjects CALCULATING
COMPUTING
COUNTING
DATA PROCESSING SYSTEMS OR METHODS, SPECIALLY ADAPTED FORADMINISTRATIVE, COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORYOR FORECASTING PURPOSES
PHYSICS
SYSTEMS OR METHODS SPECIALLY ADAPTED FOR ADMINISTRATIVE,COMMERCIAL, FINANCIAL, MANAGERIAL, SUPERVISORY OR FORECASTINGPURPOSES, NOT OTHERWISE PROVIDED FOR
title A METHOD AND APPARATUS FOR PROVIDING PREDICTIONS OF KEY PER-FORMANCE INDICATORS OF A COMPLEX MANUFACTURING SYSTEM
url https://sfx.bib-bvb.de/sfx_tum?ctx_ver=Z39.88-2004&ctx_enc=info:ofi/enc:UTF-8&ctx_tim=2025-01-05T23%3A38%3A57IST&url_ver=Z39.88-2004&url_ctx_fmt=infofi/fmt:kev:mtx:ctx&rfr_id=info:sid/primo.exlibrisgroup.com:primo3-Article-epo_EVB&rft_val_fmt=info:ofi/fmt:kev:mtx:patent&rft.genre=patent&rft.au=B%C3%84R,%20Felix&rft.date=2022-03-16&rft_id=info:doi/&rft_dat=%3Cepo_EVB%3EEP3966759A1%3C/epo_EVB%3E%3Curl%3E%3C/url%3E&disable_directlink=true&sfx.directlink=off&sfx.report_link=0&rft_id=info:oai/&rft_id=info:pmid/&rfr_iscdi=true