SAMPLE ANALYSIS SYSTEM AND CONTROL METHOD THEREFOR, AND SAMPLE ANALYSIS METHOD

SAMPLE ANALYSIS SYSTEM AND CONTROL METHOD THEREFOR, AND SAMPLE ANALYSIS METHOD

The present invention relates to the technical field of automated analysis, and provides a sample analysis system and a control method for the same and a sample analysis method. The sample analysis system includes: a control device; a rail device for carrying cuvettes under control of the control de...

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Hauptverfasser: ZHANG, Huali, XUE, Peng, YIN, Qiaobo, WU, Shaoyong, ZHANG, Huawei
Format: Patent
Sprache:eng ; fre ; ger
Schlagworte:
INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
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creator ZHANG, Huali
XUE, Peng
YIN, Qiaobo
WU, Shaoyong
ZHANG, Huawei
description The present invention relates to the technical field of automated analysis, and provides a sample analysis system and a control method for the same and a sample analysis method. The sample analysis system includes: a control device; a rail device for carrying cuvettes under control of the control device; at least one independent sample distribution node arranged on the rail device for distributing samples to the cuvettes, the independent sample distribution node being used for sample aspiration, transfer, and discharge; and at least two independent reagent distribution and measurement nodes arranged on the rail device for distributing test reagents to the cuvettes and measuring the mixture liquid in the cuvettes, the independent reagent distribution and measurement nodes being used for reagent aspiration, transfer, and discharge and reagent-sample mixture liquid measurement. Using cuvettes as the medium and employing independent sample distribution nodes and reagent distribution and measurement nodes that are combined and connected via rails, a fully automated analysis system with high freedom and high expandability is provided.
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subjects INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIRCHEMICAL OR PHYSICAL PROPERTIES
MEASURING
PHYSICS
TESTING
title SAMPLE ANALYSIS SYSTEM AND CONTROL METHOD THEREFOR, AND SAMPLE ANALYSIS METHOD
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